Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9535111 | Optical transmission of test data for testing integrated circuits | — | 2017-01-03 |
| 9506980 | Integrated circuit testing architecture | Abram M. Detofsky, Brett D. Grossman, Jin Pan, John M. Peterson | 2016-11-29 |
| 7509541 | Detection mechanism | — | 2009-03-24 |
| 7126631 | Sensing with defective cell detection | — | 2006-10-24 |
| 6614562 | Reducing dark current noise in an imaging system | — | 2003-09-02 |
| 6229158 | Stacked die integrated circuit device | Jon M. Dhuse | 2001-05-08 |
| 6093938 | Stacked die integrated circuit device | Jon M. Dhuse | 2000-07-25 |
| 5400343 | Apparatus and method for defective column detection for semiconductor memories | Brent S. Crittenden | 1995-03-21 |