TA

Todd P. Albertson

IN Intel: 18 patents #2,286 of 30,777Top 8%
Micron: 3 patents #3,077 of 6,345Top 50%
Overall (All Time): #171,016 of 4,157,543Top 5%
24
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11552432 Methods and apparatus for RF shield and cable attachment system Antonio De La Rosa 2023-01-10
11340258 Probe pins with etched tips for electrical die test Joseph D. Stanford, David Craig, Mohit Mamodia, Dingying Xu 2022-05-24
11112430 Probe head and electronic device testing system Anil Kaza, Donald E. Edenfeld, Patrick Whiting 2021-09-07
10939545 Methods and apparatus for flex circuit and cable attachment system Antonio De La Rosa 2021-03-02
10598696 Probe pins with etched tips for electrical die test Joseph D. Stanford, David Craig, Mohit Mamodia, Dingying Xu 2020-03-24
10578647 Probes for wafer sorting Jin Yang, Donald E. Edenfeld 2020-03-03
10096953 Methods and apparatus for shielded and grounded cable system Donovan M. Finnestad, James Alexander Moss, Antonio De La Rosa 2018-10-09
9977054 Etching for probe wire tips for microelectronic device test David Craig, David Shia, Joseph D. Stanford 2018-05-22
9823273 Probe tip formation for die sort and test Keith J. Martin, Kip P. Stevenson, Kamil Salloum 2017-11-21
9581639 Organic space transformer attachment and assembly Jin-Bin Yang, Erkan Acar, Joe Walczyk 2017-02-28
9535095 Anti-rotation for wire probes in a probe head of a die tester David Shia, Keith J. Martin 2017-01-03
9354273 Composite wire probe test assembly Kip P. Stevenson, David Shia, Kamil Salloum 2016-05-31
9279854 Mechanism for facilitating modular processing cell framework and application for asynchronous parallel singulated semiconductor device handling and testing John C. Johnson, Eric J. M. Moret, Robert Edmondson 2016-03-08
9255945 Micro positioning test socket and methods for active precision alignment and co-planarity feedback Abram M. Detofsky, David Shia 2016-02-09
9207258 Composite wire probes for testing integrated circuits David Shia, Kip P. Stevenson 2015-12-08
9134343 Sort probe gripper David Shia 2015-09-15
9069014 Wire probe assembly and forming process for die testing Michael T. Crocker, David Shia, Lothar Kress 2015-06-30
8962482 Multi-layer interconnect with isolation layer Darin Miller, Mark Anderson 2015-02-24
8891235 Thermal interface for multi-chip packages Joseph F. Walczyk, Jin Yang, James G. Maveety, Ashish Gupta, Jin Pan +1 more 2014-11-18
8710858 Micro positioning test socket and methods for active precision alignment and co-planarity feedback Abram M. Detofsky, David Shia 2014-04-29
7642651 Multi-layer interconnect with isolation layer Darin Miller, Mark Anderson 2010-01-05
7375033 Multi-layer interconnect with isolation layer Darin Miller, Mark Anderson 2008-05-20
7345495 Temperature and voltage controlled integrated circuit processes Daniel J. Dangelo, Hon Lee Kon, Jin Pan 2008-03-18
6360544 Anticyclone powered active thermal control unit 2002-03-26