Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11552432 | Methods and apparatus for RF shield and cable attachment system | Antonio De La Rosa | 2023-01-10 |
| 11340258 | Probe pins with etched tips for electrical die test | Joseph D. Stanford, David Craig, Mohit Mamodia, Dingying Xu | 2022-05-24 |
| 11112430 | Probe head and electronic device testing system | Anil Kaza, Donald E. Edenfeld, Patrick Whiting | 2021-09-07 |
| 10939545 | Methods and apparatus for flex circuit and cable attachment system | Antonio De La Rosa | 2021-03-02 |
| 10598696 | Probe pins with etched tips for electrical die test | Joseph D. Stanford, David Craig, Mohit Mamodia, Dingying Xu | 2020-03-24 |
| 10578647 | Probes for wafer sorting | Jin Yang, Donald E. Edenfeld | 2020-03-03 |
| 10096953 | Methods and apparatus for shielded and grounded cable system | Donovan M. Finnestad, James Alexander Moss, Antonio De La Rosa | 2018-10-09 |
| 9977054 | Etching for probe wire tips for microelectronic device test | David Craig, David Shia, Joseph D. Stanford | 2018-05-22 |
| 9823273 | Probe tip formation for die sort and test | Keith J. Martin, Kip P. Stevenson, Kamil Salloum | 2017-11-21 |
| 9581639 | Organic space transformer attachment and assembly | Jin-Bin Yang, Erkan Acar, Joe Walczyk | 2017-02-28 |
| 9535095 | Anti-rotation for wire probes in a probe head of a die tester | David Shia, Keith J. Martin | 2017-01-03 |
| 9354273 | Composite wire probe test assembly | Kip P. Stevenson, David Shia, Kamil Salloum | 2016-05-31 |
| 9279854 | Mechanism for facilitating modular processing cell framework and application for asynchronous parallel singulated semiconductor device handling and testing | John C. Johnson, Eric J. M. Moret, Robert Edmondson | 2016-03-08 |
| 9255945 | Micro positioning test socket and methods for active precision alignment and co-planarity feedback | Abram M. Detofsky, David Shia | 2016-02-09 |
| 9207258 | Composite wire probes for testing integrated circuits | David Shia, Kip P. Stevenson | 2015-12-08 |
| 9134343 | Sort probe gripper | David Shia | 2015-09-15 |
| 9069014 | Wire probe assembly and forming process for die testing | Michael T. Crocker, David Shia, Lothar Kress | 2015-06-30 |
| 8962482 | Multi-layer interconnect with isolation layer | Darin Miller, Mark Anderson | 2015-02-24 |
| 8891235 | Thermal interface for multi-chip packages | Joseph F. Walczyk, Jin Yang, James G. Maveety, Ashish Gupta, Jin Pan +1 more | 2014-11-18 |
| 8710858 | Micro positioning test socket and methods for active precision alignment and co-planarity feedback | Abram M. Detofsky, David Shia | 2014-04-29 |
| 7642651 | Multi-layer interconnect with isolation layer | Darin Miller, Mark Anderson | 2010-01-05 |
| 7375033 | Multi-layer interconnect with isolation layer | Darin Miller, Mark Anderson | 2008-05-20 |
| 7345495 | Temperature and voltage controlled integrated circuit processes | Daniel J. Dangelo, Hon Lee Kon, Jin Pan | 2008-03-18 |
| 6360544 | Anticyclone powered active thermal control unit | — | 2002-03-26 |