Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823273 | Probe tip formation for die sort and test | Keith J. Martin, Kamil Salloum, Todd P. Albertson | 2017-11-21 |
| 9354273 | Composite wire probe test assembly | Todd P. Albertson, David Shia, Kamil Salloum | 2016-05-31 |
| 9207258 | Composite wire probes for testing integrated circuits | David Shia, Todd P. Albertson | 2015-12-08 |