Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 11112430 | Probe head and electronic device testing system | Anil Kaza, Todd P. Albertson, Patrick Whiting | 2021-09-07 | $31,495,000 |
| 10578647 | Probes for wafer sorting | Todd P. Albertson, Jin Yang | 2020-03-03 | $18,388,000 |
| 6768297 | High speed VLSI digital tester architecture for real-time output timing acquisition, results accumulation, and analysis | John C. Johnson, Christopher J. Nelson | 2004-07-27 | $71,560,000 |