Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11340258 | Probe pins with etched tips for electrical die test | David Craig, Todd P. Albertson, Mohit Mamodia, Dingying Xu | 2022-05-24 |
| 10598696 | Probe pins with etched tips for electrical die test | David Craig, Todd P. Albertson, Mohit Mamodia, Dingying Xu | 2020-03-24 |
| 9977054 | Etching for probe wire tips for microelectronic device test | Todd P. Albertson, David Craig, David Shia | 2018-05-22 |