TM

Tak M. Mak

IN Intel: 17 patents #2,418 of 30,777Top 8%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
Overall (All Time): #219,081 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11557420 Coupling inductors in an IC device using interconnecting elements with solder caps and resulting devices Ajit M. Dubey 2023-01-17
10673723 Systems and methods for dynamically reconfiguring automatic test equipment Louis Yehuda UNGAR, Neil G. Jacobson 2020-06-02
9646758 Method of fabricating integrated circuit (IC) devices Ajit M. Dubey 2017-05-09
9551741 Current tests for I/O interface connectors Bharani Thiruvengadam, Mladenko Vukic 2017-01-24
9110134 Input/output delay testing for devices utilizing on-chip delay generation Christopher J. Nelson, David J. Zimmerman, Derek B. Feltham 2015-08-18
8926196 Method and apparatus for an optical interconnect system Abram M. Detofsky, Chukwunenye S. Nnebe, Jin Yang, Sasha N. Oster 2015-01-06
8843794 Method, system and apparatus for evaluation of input/output buffer circuitry Christopher J. Nelson, David J. Zimmerman, Pete D. Vogt 2014-09-23
7373572 System pulse latch and shadow pulse latch coupled to output joining circuit Ming Zhang, Subhasish Mitra, Paul E. Shipley 2008-05-13
7278074 System and shadow circuits with output joining circuit Subhasish Mitra, Ming Zhang, Quan Shi, Kee Sup Kim 2007-10-02
7278076 System and scanout circuits with error resilience circuit Ming Zhang, Subhasish Mitra, Victor Zia 2007-10-02
7188284 Error detecting circuit Subhasish Mitra, Kee Sup Kim, Prashant Goteti 2007-03-06
7185247 Pseudo bus agent to support functional testing Li Chen 2007-02-27
6975954 Functional testing of logic circuits that use high-speed links Victor W. Lee 2005-12-13
6885209 Device testing Michael J. Tripp 2005-04-26
6757209 Memory cell structural test Michael R. Spica, Michael J. Tripp 2004-06-29
6721216 Memory addressing structural test Michael R. Spica, Michael J. Tripp 2004-04-13
6629274 Method and apparatus to structurally detect random defects that impact AC I/O timings in an input/output buffer Mike Tripp, Alper Ilkbahar, R. Tim Frodsham 2003-09-30
6424926 Bus signature analyzer and behavioral functional test method 2002-07-23
6222246 Flip-chip having an on-chip decoupling capacitor Paul Winer, Valluri Rao, Richard H. Livengood 2001-04-24
5621739 Method and apparatus for buffer self-test and characterization Christopher John Sine, Alper Ilkbahar 1997-04-15