| 11557420 |
Coupling inductors in an IC device using interconnecting elements with solder caps and resulting devices |
Ajit M. Dubey |
2023-01-17 |
$285,462,000 |
| 10673723 |
Systems and methods for dynamically reconfiguring automatic test equipment |
Louis Yehuda UNGAR, Neil G. Jacobson |
2020-06-02 |
|
| 9646758 |
Method of fabricating integrated circuit (IC) devices |
Ajit M. Dubey |
2017-05-09 |
$10,322,000 |
| 9551741 |
Current tests for I/O interface connectors |
Bharani Thiruvengadam, Mladenko Vukic |
2017-01-24 |
$12,666,000 |
| 9110134 |
Input/output delay testing for devices utilizing on-chip delay generation |
Christopher J. Nelson, David J. Zimmerman, Derek B. Feltham |
2015-08-18 |
$11,320,000 |
| 8926196 |
Method and apparatus for an optical interconnect system |
Abram M. Detofsky, Chukwunenye S. Nnebe, Jin Yang, Sasha N. Oster |
2015-01-06 |
$26,007,000 |
| 8843794 |
Method, system and apparatus for evaluation of input/output buffer circuitry |
Christopher J. Nelson, David J. Zimmerman, Pete D. Vogt |
2014-09-23 |
$19,543,000 |
| 7373572 |
System pulse latch and shadow pulse latch coupled to output joining circuit |
Ming Zhang, Subhasish Mitra, Paul E. Shipley |
2008-05-13 |
$17,373,000 |
| 7278074 |
System and shadow circuits with output joining circuit |
Subhasish Mitra, Ming Zhang, Quan Shi, Kee Sup Kim |
2007-10-02 |
$20,761,000 |
| 7278076 |
System and scanout circuits with error resilience circuit |
Ming Zhang, Subhasish Mitra, Victor Zia |
2007-10-02 |
$20,761,000 |
| 7188284 |
Error detecting circuit |
Subhasish Mitra, Kee Sup Kim, Prashant Goteti |
2007-03-06 |
$17,685,000 |
| 7185247 |
Pseudo bus agent to support functional testing |
Li Chen |
2007-02-27 |
$10,067,000 |
| 6975954 |
Functional testing of logic circuits that use high-speed links |
Victor W. Lee |
2005-12-13 |
$11,810,000 |
| 6885209 |
Device testing |
Michael J. Tripp |
2005-04-26 |
$30,166,000 |
| 6757209 |
Memory cell structural test |
Michael R. Spica, Michael J. Tripp |
2004-06-29 |
$34,137,000 |
| 6721216 |
Memory addressing structural test |
Michael R. Spica, Michael J. Tripp |
2004-04-13 |
$35,249,000 |
| 6629274 |
Method and apparatus to structurally detect random defects that impact AC I/O timings in an input/output buffer |
Mike Tripp, Alper Ilkbahar, R. Tim Frodsham |
2003-09-30 |
$25,999,000 |
| 6424926 |
Bus signature analyzer and behavioral functional test method |
— |
2002-07-23 |
$72,932,000 |
| 6222246 |
Flip-chip having an on-chip decoupling capacitor |
Paul Winer, Valluri Rao, Richard H. Livengood |
2001-04-24 |
$172,753,000 |
| 5621739 |
Method and apparatus for buffer self-test and characterization |
Christopher John Sine, Alper Ilkbahar |
1997-04-15 |
$49,693,000 |
