Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11557420 | Coupling inductors in an IC device using interconnecting elements with solder caps and resulting devices | Ajit M. Dubey | 2023-01-17 |
| 10673723 | Systems and methods for dynamically reconfiguring automatic test equipment | Louis Yehuda UNGAR, Neil G. Jacobson | 2020-06-02 |
| 9646758 | Method of fabricating integrated circuit (IC) devices | Ajit M. Dubey | 2017-05-09 |
| 9551741 | Current tests for I/O interface connectors | Bharani Thiruvengadam, Mladenko Vukic | 2017-01-24 |
| 9110134 | Input/output delay testing for devices utilizing on-chip delay generation | Christopher J. Nelson, David J. Zimmerman, Derek B. Feltham | 2015-08-18 |
| 8926196 | Method and apparatus for an optical interconnect system | Abram M. Detofsky, Chukwunenye S. Nnebe, Jin Yang, Sasha N. Oster | 2015-01-06 |
| 8843794 | Method, system and apparatus for evaluation of input/output buffer circuitry | Christopher J. Nelson, David J. Zimmerman, Pete D. Vogt | 2014-09-23 |
| 7373572 | System pulse latch and shadow pulse latch coupled to output joining circuit | Ming Zhang, Subhasish Mitra, Paul E. Shipley | 2008-05-13 |
| 7278074 | System and shadow circuits with output joining circuit | Subhasish Mitra, Ming Zhang, Quan Shi, Kee Sup Kim | 2007-10-02 |
| 7278076 | System and scanout circuits with error resilience circuit | Ming Zhang, Subhasish Mitra, Victor Zia | 2007-10-02 |
| 7188284 | Error detecting circuit | Subhasish Mitra, Kee Sup Kim, Prashant Goteti | 2007-03-06 |
| 7185247 | Pseudo bus agent to support functional testing | Li Chen | 2007-02-27 |
| 6975954 | Functional testing of logic circuits that use high-speed links | Victor W. Lee | 2005-12-13 |
| 6885209 | Device testing | Michael J. Tripp | 2005-04-26 |
| 6757209 | Memory cell structural test | Michael R. Spica, Michael J. Tripp | 2004-06-29 |
| 6721216 | Memory addressing structural test | Michael R. Spica, Michael J. Tripp | 2004-04-13 |
| 6629274 | Method and apparatus to structurally detect random defects that impact AC I/O timings in an input/output buffer | Mike Tripp, Alper Ilkbahar, R. Tim Frodsham | 2003-09-30 |
| 6424926 | Bus signature analyzer and behavioral functional test method | — | 2002-07-23 |
| 6222246 | Flip-chip having an on-chip decoupling capacitor | Paul Winer, Valluri Rao, Richard H. Livengood | 2001-04-24 |
| 5621739 | Method and apparatus for buffer self-test and characterization | Christopher John Sine, Alper Ilkbahar | 1997-04-15 |