Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12213288 | Self cooling adaptive flow branching heat exchanger system for cooling of one or more semiconductor chips | Prabhakar Subrahmanyam, Victor Polyanko, Ying-Feng PANG, Yi Xia, Pooya Tadayon +2 more | 2025-01-28 |
| 11439037 | Jet vectoring fluid impingement cooling using pivoting nozzles | Prabhakar Subrahmanyam | 2022-09-06 |
| 10817516 | Result types for conditional data display | Charles Keller Smith, Jonathan Thomas Campbell, Zhenguang Chen, Boxin Li, Charles Reeves Little, II +3 more | 2020-10-27 |
| 10210260 | Templates for displaying data | Jonathan Thomas Campbell, Zhenguang Chen, Anthony Jackson, Ping-Ju Jiang, Boxin Li +5 more | 2019-02-19 |
| 9652545 | Result types for conditional data display | Charles Keller Smith, Jonathan Thomas Campbell, Zhenguang Chen, Boxin Li, Charles Reeves Little, II +3 more | 2017-05-16 |
| 9377486 | Thermal interface material handling for thermal control of an electronic component under test | David W. Song, Christopher R. Schroeder, Joseph F. Walczyk, Lothar Kress, Todd Young +4 more | 2016-06-28 |
| 9135358 | Result types for conditional data display | Jonathan Thomas Campbell, Zhenguang Chen, Boxin Li, Charles Reeves Little, II, Charles Keller Smith +3 more | 2015-09-15 |
| 8891235 | Thermal interface for multi-chip packages | Joseph F. Walczyk, Jin Yang, James G. Maveety, Todd P. Albertson, Ashish Gupta +1 more | 2014-11-18 |
| 8701127 | Web services access to content items stored by collaboration systems | Siddharth Shah, Ramanathan Somasundaram | 2014-04-15 |
| 8321444 | Federated search | David Mowatt, Niket Patwardhan, Puneet Narula, Thomas Matthew Laird-McConnell | 2012-11-27 |
| 7412346 | Real-time temperture detection during test | Mo S. Bashir | 2008-08-12 |
| 7233163 | Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit | Abram M. Detofsky | 2007-06-19 |
| 7071723 | Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit | Abram M. Detofsky | 2006-07-04 |