| 12213288 |
Self cooling adaptive flow branching heat exchanger system for cooling of one or more semiconductor chips |
Prabhakar Subrahmanyam, Victor Polyanko, Ying-Feng PANG, Yi Xia, Pooya Tadayon +2 more |
2025-01-28 |
| 11439037 |
Jet vectoring fluid impingement cooling using pivoting nozzles |
Prabhakar Subrahmanyam |
2022-09-06 |
| 10817516 |
Result types for conditional data display |
Charles Keller Smith, Jonathan Thomas Campbell, Zhenguang Chen, Boxin Li, Charles Reeves Little, II +3 more |
2020-10-27 |
| 10210260 |
Templates for displaying data |
Jonathan Thomas Campbell, Zhenguang Chen, Anthony Jackson, Ping-Ju Jiang, Boxin Li +5 more |
2019-02-19 |
| 9652545 |
Result types for conditional data display |
Charles Keller Smith, Jonathan Thomas Campbell, Zhenguang Chen, Boxin Li, Charles Reeves Little, II +3 more |
2017-05-16 |
| 9377486 |
Thermal interface material handling for thermal control of an electronic component under test |
David W. Song, Christopher R. Schroeder, Joseph F. Walczyk, Lothar Kress, Todd Young +4 more |
2016-06-28 |
| 9135358 |
Result types for conditional data display |
Jonathan Thomas Campbell, Zhenguang Chen, Boxin Li, Charles Reeves Little, II, Charles Keller Smith +3 more |
2015-09-15 |
| 8891235 |
Thermal interface for multi-chip packages |
Joseph F. Walczyk, Jin Yang, James G. Maveety, Todd P. Albertson, Ashish Gupta +1 more |
2014-11-18 |
| 8701127 |
Web services access to content items stored by collaboration systems |
Siddharth Shah, Ramanathan Somasundaram |
2014-04-15 |
| 8321444 |
Federated search |
David Mowatt, Niket Patwardhan, Puneet Narula, Thomas Matthew Laird-McConnell |
2012-11-27 |
| 7412346 |
Real-time temperture detection during test |
Mo S. Bashir |
2008-08-12 |
| 7233163 |
Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
Abram M. Detofsky |
2007-06-19 |
| 7071723 |
Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
Abram M. Detofsky |
2006-07-04 |
