Patents per Year
Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 11476168 | Die stack override for die testing | Terrence Huat Hin Tan, Michael T. Klinglesmith, Sukhbinder Takhar, Shi Hou Chong, Kok Hin Oon +3 more | 2022-10-18 | $11,317,000 |
| 10247773 | Systems and methods for wireless device testing | Sankaran M. Menon, Rolf Kuehnis, John M. Peterson, Asifur Rahman, Abram M. Detofsky +1 more | 2019-04-02 | $26,887,000 |
| 9229720 | Circuit marginality validation test for an integrated circuit | Antonio Castro, Mohammad Al-Aqrabawi, Brad A. Kelly | 2016-01-05 | $11,513,000 |