| 12292472 |
Testing a single chip in a wafer probing system |
Alejandro Alberto Cook Lobo, Otto A. Torreiter |
2025-05-06 |
|
| 11808808 |
Testing a single chip in a wafer probing system |
Alejandro Alberto Cook Lobo, Otto A. Torreiter |
2023-11-07 |
$6,695,000 |
| 11574695 |
Logic built-in self-test of an electronic circuit |
Alejandro Alberto Cook Lobo, Michael Kugel, Otto A. Torreiter |
2023-02-07 |
$6,435,000 |
| 11239152 |
Integrated circuit with optical tunnel |
Otto A. Torreiter, Martin Eckert |
2022-02-01 |
$4,586,000 |
| 11074147 |
Continuous mutual extended processor self-test |
Tobias U. Bergmann, Oliver Benke |
2021-07-27 |
$4,187,000 |
| 10768232 |
ATE compatible high-efficient functional test |
Jens Kuenzer, Cedric Lichtenau, Martin Padeffke |
2020-09-08 |
$3,136,000 |
| 10746790 |
Constrained pseudorandom test pattern for in-system logic built-in self-test |
Alejandro Alberto Cook Lobo, Daniel Kiss, Jens Kuenzer |
2020-08-18 |
$3,155,000 |
| 10684930 |
Functional testing of high-speed serial links |
Martin Eckert, Marta Junginger, Eckhard Kunigkeit, Matthias Pflanz, Quintino L. Trianni |
2020-06-16 |
$3,682,000 |
| 10288684 |
On-chip hardware-controlled window strobing |
Daniel Rodko, Hagen Schmidt, Otto A. Torreiter |
2019-05-14 |
$3,761,000 |
| 10281527 |
On-chip hardware-controlled window strobing |
Daniel Rodko, Hagen Schmidt, Otto A. Torreiter |
2019-05-07 |
$2,760,000 |
| 10114914 |
Layout effect characterization for integrated circuits |
Martin Eckert, Jens Kuenzer, Antje Mueller, Thomas Strach, Otto A. Torreiter |
2018-10-30 |
$2,799,000 |
| 9904748 |
Layout effect characterization for integrated circuits |
Martin Eckert, Jens Kuenzer, Antje Mueller, Thomas Strach, Otto A. Torreiter |
2018-02-27 |
$3,821,000 |
| 9740813 |
Layout effect characterization for integrated circuits |
Martin Eckert, Jens Kuenzer, Antje Mueller, Thomas Strach, Otto A. Torreiter |
2017-08-22 |
$2,056,000 |
| 9354275 |
Testing an integrated circuit |
Birol Akdemir, Oliver Marquardt |
2016-05-31 |
$2,120,000 |
| 9319030 |
Integrated circuit failure prediction using clock duty cycle recording and analysis |
Klaus P. Gungl, Guenther Hutzl |
2016-04-19 |
$3,648,000 |
| 5846583 |
Temperature sensing method and system for pasteurization |
— |
1998-12-08 |
|
| 5704597 |
Radial bearing and trouble support having the radial bearing |
Manfred Hofmann, Kai Brauer |
1998-01-06 |
|
