Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10684930 | Functional testing of high-speed serial links | Martin Eckert, Thomas Gentner, Eckhard Kunigkeit, Matthias Pflanz, Quintino L. Trianni | 2020-06-16 |
| 8180142 | Test fail analysis on VLSI chips | Martin Eckert, Georg Goecke, Klaus Kempter, Markus Ulbricht | 2012-05-15 |
| 8001501 | Method for circuit design | Rainer Dorsch, Philipp Salz, Andreas Wagner, Gerhard Zilles | 2011-08-16 |