| 11262381 |
Device for positioning a semiconductor die in a wafer prober |
Otto A. Torreiter, Jörg Georg Appinger, Quintino L. Trianni |
2022-03-01 |
$6,542,000 |
| 11239152 |
Integrated circuit with optical tunnel |
Otto A. Torreiter, Thomas Gentner |
2022-02-01 |
$4,586,000 |
| 11209479 |
Stressing integrated circuits using a radiation source |
Matthias Pflanz, Otto A. Torreiter, Juergen Pille |
2021-12-28 |
$7,175,000 |
| 10955440 |
Probe card alignment |
Roland Dieterle, Siegfried Tomaschko |
2021-03-23 |
$2,115,000 |
| 10684930 |
Functional testing of high-speed serial links |
Thomas Gentner, Marta Junginger, Eckhard Kunigkeit, Matthias Pflanz, Quintino L. Trianni |
2020-06-16 |
$3,682,000 |
| 10614884 |
Content addressable memory with match hit quality indication |
Alexander Fritsch |
2020-04-07 |
$1,846,000 |
| 10605649 |
Adjustable load transmitter |
Siegfried Tomaschko, Roland Dieterle |
2020-03-31 |
$1,667,000 |
| 10527649 |
Probe card alignment |
Roland Dieterle, Siegfried Tomaschko |
2020-01-07 |
$1,754,000 |
| 10422817 |
Probe card alignment |
Roland Dieterle, Siegfried Tomaschko |
2019-09-24 |
$3,094,000 |
| 10347337 |
Content addressable memory with match hit quality indication |
Alexander Fritsch |
2019-07-09 |
$2,201,000 |
| 10345136 |
Adjustable load transmitter |
Siegfried Tomaschko, Roland Dieterle |
2019-07-09 |
$2,201,000 |
| 10146144 |
Adjustable load transmitter |
Siegfried Tomaschko, Roland Dieterle |
2018-12-04 |
$4,080,000 |
| 10114069 |
Method for electrical testing of a 3-D chip stack |
Eckhard Kunigkeit, Otto A. Torreiter, Quintino L. Trianni |
2018-10-30 |
$2,799,000 |
| 10114914 |
Layout effect characterization for integrated circuits |
Thomas Gentner, Jens Kuenzer, Antje Mueller, Thomas Strach, Otto A. Torreiter |
2018-10-30 |
$2,799,000 |
| 10082419 |
Adjustable load transmitter |
Siegfried Tomaschko, Roland Dieterle |
2018-09-25 |
$2,527,000 |
| 10082526 |
Probe card alignment |
Roland Dieterle, Siegfried Tomaschko |
2018-09-25 |
$2,527,000 |
| 10056346 |
Chip attach frame |
Otto A. Torreiter, Quintino L. Trianni |
2018-08-21 |
$2,787,000 |
| 9977053 |
Wafer probe alignment |
Joerg G. Appinger, Eberhard Dengler, Roland Dieterle, Gabriele Kuczera, Siegfried Tomaschko +2 more |
2018-05-22 |
$7,737,000 |
| 9927463 |
Wafer probe alignment |
Joerg G. Appinger, Eberhard Dengler, Roland Dieterle, Gabriele Kuczera, Siegfried Tomaschko +2 more |
2018-03-27 |
$2,459,000 |
| 9904748 |
Layout effect characterization for integrated circuits |
Thomas Gentner, Jens Kuenzer, Antje Mueller, Thomas Strach, Otto A. Torreiter |
2018-02-27 |
$3,821,000 |
| 9892789 |
Content addressable memory with match hit quality indication |
Alexander Fritsch |
2018-02-13 |
$2,196,000 |
| 9891272 |
Module testing utilizing wafer probe test equipment |
Eckhard Kunigkeit, Quintino L. Trianni, Christian Zoellin |
2018-02-13 |
$2,196,000 |
| 9885748 |
Module testing utilizing wafer probe test equipment |
Eckhard Kunigkeit, Quintino L. Trianni, Christian Zoellin |
2018-02-06 |
$2,625,000 |
| 9804231 |
Power noise histogram of a computer system |
Hubert Harrer, Thomas Strach |
2017-10-31 |
$7,902,000 |
| 9740813 |
Layout effect characterization for integrated circuits |
Thomas Gentner, Jens Kuenzer, Antje Mueller, Thomas Strach, Otto A. Torreiter |
2017-08-22 |
$2,056,000 |
