| 10684930 |
Functional testing of high-speed serial links |
Martin Eckert, Thomas Gentner, Marta Junginger, Matthias Pflanz, Quintino L. Trianni |
2020-06-16 |
| 10114069 |
Method for electrical testing of a 3-D chip stack |
Martin Eckert, Otto A. Torreiter, Quintino L. Trianni |
2018-10-30 |
| 9921268 |
Auto-alignment of backer plate for direct docking test boards |
Eberhard Dengler, Gabriele Kuczera, Siegfried Tomaschko, Quintino L. Trianni |
2018-03-20 |
| 9891272 |
Module testing utilizing wafer probe test equipment |
Martin Eckert, Quintino L. Trianni, Christian Zoellin |
2018-02-13 |
| 9885748 |
Module testing utilizing wafer probe test equipment |
Martin Eckert, Quintino L. Trianni, Christian Zoellin |
2018-02-06 |
| 9726719 |
Semiconductor automatic test equipment |
Gabriele Kuczera, Quintino L. Trianni |
2017-08-08 |
| 9496188 |
Soldering three dimensional integrated circuits |
Martin Eckert, Otto A. Torreiter, Quintino L. Trianni |
2016-11-15 |
| 9250289 |
System for electrical testing and manufacturing of a 3-D chip stack and method |
Martin Eckert, Otto A. Torreiter, Quintino L. Trianni |
2016-02-02 |
| 6710269 |
Foil keyboard with security system |
Thomas Walz |
2004-03-23 |
| 5794365 |
Method and apparatus for turning a page in a book |
Erich Hindermeyer, Siegbert Link |
1998-08-18 |
