Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9977053 | Wafer probe alignment | Eberhard Dengler, Roland Dieterle, Martin Eckert, Gabriele Kuczera, Siegfried Tomaschko +2 more | 2018-05-22 |
| 9927463 | Wafer probe alignment | Eberhard Dengler, Roland Dieterle, Martin Eckert, Gabriele Kuczera, Siegfried Tomaschko +2 more | 2018-03-27 |
| 7225376 | Method and system for coding test pattern for scan design | Michael Kessler, Manfred Schmidt | 2007-05-29 |
| 6983407 | Random pattern weight control by pseudo random bit pattern generator initialization | Michael Kessler, Manfred Schmidt | 2006-01-03 |