SG

Stephen M. Gates

IBM: 121 patents #407 of 70,183Top 1%
Globalfoundries: 3 patents #1,029 of 4,424Top 25%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
Applied Materials: 1 patents #4,780 of 7,310Top 70%
SO Sonsub: 1 patents #7 of 17Top 45%
CM Chartered Semiconductor Manufacturing: 1 patents #419 of 840Top 50%
Samsung: 1 patents #49,284 of 75,807Top 70%
📍 New York, NY: #24 of 20,192 inventorsTop 1%
🗺 New York: #321 of 115,490 inventorsTop 1%
Overall (All Time): #8,493 of 4,157,543Top 1%
129
Patents All Time

Issued Patents All Time

Showing 26–50 of 129 patents

Patent #TitleCo-InventorsDate
8860095 Interconnect wiring switches and integrated circuits including the same Daniel C. Edelstein, Kailash Gopalakrishnan, Ramachandran Muralidhar 2014-10-14
8759976 Structure with sub-lithographic random conductors as a physical unclonable function Daniel C. Edelstein, Gregory M. Fritz, Dirk Pfeiffer 2014-06-24
8753927 Low cost anti-fuse structure and method to make same Chih-Chao Yang 2014-06-17
8658488 Method for forming semiconductor chip with graphene based devices in an interconnect structure of the chip Christos D. Dimitrakopoulos, Guy M. Cohen, Alfred Grill, Timothy J. McArdle, Chun-Yung Sung 2014-02-25
8637957 Low cost anti-fuse structure Chih-Chao Yang 2014-01-28
8624323 BEOL structures incorporating active devices and mechanical strength Daniel C. Edelstein, Satyanarayana V. Nitta 2014-01-07
8618183 Materials containing voids with void size controlled on the nanometer scale Alfred Grill, Deborah A. Neumayer, Son V. Nguyen, Vishnubhai V. Patel 2013-12-31
8525169 Reliable physical unclonable function for device authentication Daniel C. Edelstein, Edward W. Kiewra, Satyanarayana V. Nitta, Ramachandran Muralidhar, Dirk Pfeiffer 2013-09-03
8491987 Selectively coated self-aligned mask Matthew E. Colburn, Jeffrey Hedrick, Elbert E. Huang, Satyanarayana V. Nitta, Sampath Purushothaman +1 more 2013-07-23
8440999 Semiconductor chip with graphene based devices in an interconnect structure of the chip Christos D. Dimitrakopoulos, Guy M. Cohen, Alfred Grill, Timothy J. McArdle, Chun-Yung Sung 2013-05-14
8386859 On-chip non-volatile storage of a test-time profile for efficiency and performance control Eren Kursun, Philip G. Emma 2013-02-26
8357608 Multi component dielectric layer Alfred Grill, Son V. Nguyen, Satyanarayana V. Nitta 2013-01-22
8276018 Non-volatile memory based reliability and availability mechanisms for a computing device Eren Kursun, Philip G. Emma 2012-09-25
8268411 Materials containing voids with void size controlled on the nanometer scale Alfred Grill, Deborah A. Neumayer, Son V. Nguyen, Vishnubhai V. Patel 2012-09-18
8101236 Method of fabricating a SiCOH dielectric material with improved toughness and improved Si-C bonding Daniel C. Edelstein, Alfred Grill, Michael Lane, Qinghuang Lin, Robert D. Miller +2 more 2012-01-24
8097932 Ultra low κ plasma enhanced chemical vapor deposition processes using a single bifunctional precursor containing both a SiCOH matrix functionality and organic porogen functionality Son V. Nguyen, Deborah A. Neumayer, Alfred Grill 2012-01-17
7955968 Pseudo hybrid structure for low K interconnect integration Pak K. Leung, Terry G. Sparks, David V. Horak 2011-06-07
7948051 Nonlithographic method to produce self-aligned mask, articles produced by same and compositions for same Matthew E. Colburn, Jeffrey Hedrick, Elbert E. Huang, Satyanarayana V. Nitta, Sampath Purushothaman +1 more 2011-05-24
7948083 Reliable BEOL integration process with direct CMP of porous SiCOH dielectric Christos D. Dimitrakopoulos, Vincent J. McGahay, Sanjay C. Mehta 2011-05-24
7915180 SiCOH film preparation using precursors with built-in porogen functionality Alfred Grill, Robert D. Miller, Deborah A. Neumayer, Son V. Nguyen 2011-03-29
7892648 SiCOH dielectric material with improved toughness and improved Si-C bonding Daniel C. Edelstein, Alfred Grill, Michael Lane, Robert D. Miller, Deborah A. Neumayer +1 more 2011-02-22
7863749 Electronic structures utilizing etch resistant boron and phosphorus materials and methods to form same Robert D. Miller 2011-01-04
7847402 BEOL interconnect structures with improved resistance to stress Darryl D. Restaino, Griselda Bonilla, Christos D. Dimitrakopoulos, Jae Hak Kim, Michael Lane +4 more 2010-12-07
7811926 Multilayer hardmask scheme for damage-free dual damascene processing of SiCOH dielectrics Nicholas C. M. Fuller, Timothy J. Dalton 2010-10-12
7726008 Method of forming a magnetic-field sensor having magnetic nanoparticles Charles T. Black, Christopher B. Murray, Robert L. Sandstrom 2010-06-01