MF

Martin M. Frank

IBM: 114 patents #453 of 70,183Top 1%
CN CNRS: 3 patents #978 of 11,908Top 9%
UL Ulvac: 3 patents #134 of 680Top 20%
AS Agere Systems: 2 patents #639 of 1,849Top 35%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
MC Macronix International Co.: 1 patents #718 of 1,241Top 60%
📍 Dobbs Ferry, NY: #1 of 324 inventorsTop 1%
🗺 New York: #401 of 115,490 inventorsTop 1%
Overall (All Time): #10,324 of 4,157,543Top 1%
118
Patents All Time

Issued Patents All Time

Showing 76–100 of 118 patents

Patent #TitleCo-InventorsDate
8859410 Gate stack of boron semiconductor alloy, polysilicon and high-k gate dielectric for low voltage applications Isaac Lauer, Jeffrey W. Sleight 2014-10-14
8853751 Reducing the inversion oxide thickness of a high-K stack fabricated on high mobility semiconductor material Takashi Ando, Vijay Narayanan 2014-10-07
8836048 Field effect transistor device having a hybrid metal gate stack Cyril Cabral, Jr., Josephine B. Chang, Michael P. Chudzik, Michael A. Guillorn, Christian Lavoie +2 more 2014-09-16
8836037 Structure and method to form input/output devices Takashi Ando, Min Dai, Barry P. Linder, Shahab Siddiqui 2014-09-16
8802527 Gate electrode optimized for low voltage operation Isaac Lauer, Jeffrey W. Sleight 2014-08-12
8785995 Ferroelectric semiconductor transistor devices having gate modulated conductive layer Catherine A. Dubourdieu, David J. Frank, Vijay Narayanan, Paul M. Solomon, Thomas Theis 2014-07-22
8778759 Gate electrode optimized for low voltage operation Isaac Lauer, Jeffrey W. Sleight 2014-07-15
8753936 Changing effective work function using ion implantation during dual work function metal gate integration Michael P. Chudzik, Herbert L. Ho, Mark J. Hurley, Rashmi Jha, Naim Moumen +3 more 2014-06-17
8716807 Fabrication of devices having different interfacial oxide thickness via lateral oxidation Jin Cai, Eduard A. Cartier, Marwan H. Khater 2014-05-06
8680623 Techniques for enabling multiple Vt devices using high-K metal gate stacks Arvind Kumar, Vijay Narayanan, Vamsi K. Paruchuri, Jeffrey W. Sleight 2014-03-25
8674456 High-K transistors with low threshold voltage 2014-03-18
8598027 High-K transistors with low threshold voltage 2013-12-03
8598665 Controlling threshold voltage in carbon based field effect transistors Dechao Guo, Shu-Jen Hen, Kuen-Ting Shiu 2013-12-03
8559217 Phase change material cell with stress inducer liner Catherine A. Dubourdieu, Bipin Rajendran, Alejandro G. Schrott 2013-10-15
8541867 Metal insulator metal structure with remote oxygen scavenging 2013-09-24
8541842 High-k transistors with low threshold voltage 2013-09-24
8420474 Controlling threshold voltage in carbon based field effect transistors Dechao Guo, Shu-Jen Hen, Kuen-Ting Shiu 2013-04-16
8415677 Field-effect transistor device having a metal gate stack with an oxygen barrier layer Praneet Adusumilli, Alessandro C. Callegari, Josephine B. Chang, Changhwan Choi, Michael A. Guillorn +1 more 2013-04-09
8389300 Controlling ferroelectricity in dielectric films by process induced uniaxial strain Catherine A. Dubourdieu 2013-03-05
8367496 Scavanging metal stack for a high-k gate dielectric Takashi Ando, Changhwan Choi, Vijay Narayanan 2013-02-05
8304306 Fabrication of devices having different interfacial oxide thickness via lateral oxidation Jin Cai, Eduard A. Cartier, Marwan H. Khater 2012-11-06
8212322 Techniques for enabling multiple Vt devices using high-K metal gate stacks Arvind Kumar, Vijay Narayanan, Vamsi K. Paruchuri, Jeffrey W. Sleight 2012-07-03
8193051 Selective implementation of barrier layers to achieve threshold voltage control in CMOS device fabrication with high-k dielectrics Nestor A. Bojarczuk, Cyril Cabral, Jr., Eduard A. Cartier, Matthew W. Copel, Evgeni Gousev +4 more 2012-06-05
8178382 Suspended germanium photodetector for silicon waveguide Solomon Assefa, Jack O. Chu, William M. Green, Young-Hee Kim, George G. Totir +3 more 2012-05-15
7989902 Scavenging metal stack for a high-k gate dielectric Takashi Ando, Changhwan Choi, Vijay Narayanan 2011-08-02