KF

Keith E. Fogel

IBM: 260 patents #100 of 70,183Top 1%
Globalfoundries: 11 patents #330 of 4,424Top 8%
KT King Abdulaziz City For Science And Technology: 8 patents #16 of 573Top 3%
EC Egypt Nanotechnology Center: 2 patents #17 of 29Top 60%
IM International Machines: 1 patents #1 of 34Top 3%
ST S.O.I. Tec Silicon On Insulator Technologies: 1 patents #92 of 155Top 60%
📍 Hopewell Junction, NY: #2 of 648 inventorsTop 1%
🗺 New York: #74 of 115,490 inventorsTop 1%
Overall (All Time): #1,636 of 4,157,543Top 1%
272
Patents All Time

Issued Patents All Time

Showing 76–100 of 272 patents

Patent #TitleCo-InventorsDate
9713250 Patterned metallization handle layer for controlled spalling Turki bin Saud bin Mohammed Al-Saud, Stephen W. Bedell, Paul A. Lauro, Devendra K. Sadana 2017-07-18
9704860 Epitaxial oxide fin segments to prevent strained semiconductor fin end relaxation Karthik Balakrishnan, Sivananda K. Kanakasabapathy, Alexander Reznicek 2017-07-11
9666674 Formation of large scale single crystalline graphene Christos D. Dimitrakopoulos, Jeehwan Kim, Hongsik Park 2017-05-30
9660116 Nanowires formed by employing solder nanodots Jeehwan Kim, Jae-Woong Nah, Devendra K. Sadana, Kuen-Ting Shiu 2017-05-23
9653570 Junction interlayer dielectric for reducing leakage current in semiconductor devices Joel P. de Souza, Jeehwan Kim, Devendra K. Sadana, Brent A. Wacaser 2017-05-16
9646832 Porous fin as compliant medium to form dislocation-free heteroepitaxial films Kangguo Cheng, Jeehwan Kim, Devendra K. Sadana 2017-05-09
9634164 Reduced light degradation due to low power deposition of buffer layer Augustin J. Hong, Jeehwan Kim, Devendra K. Sadana 2017-04-25
9620592 Doped zinc oxide and n-doping to reduce junction leakage Joel P. de Souza, Jeehwan Kim, Siegfried Maurer, Devendra K. Sadana 2017-04-11
9601624 SOI based FINFET with strained source-drain regions Stephen W. Bedell, Joel P. de Souza, Alexander Reznicek, Devendra K. Sadana, Dominic J. Schepis 2017-03-21
9601482 Economical and environmentally friendly chemical mechanical polishing for III-V compound semiconductor device fabrication Alexander Reznicek, Devendra K. Sadana, Charan V. Surisetty 2017-03-21
9583572 FinFET devices having silicon germanium channel fin structures with uniform thickness Veeraraghavan S. Basker, Pouya Hashemi, Alexander Reznicek 2017-02-28
9576806 FinFET device with vertical silicide on recessed source/drain epitaxy regions Pranita Kerber, Qiqing C. Ouyang, Alexander Reznicek 2017-02-21
9574287 Gallium nitride material and device deposition on graphene terminated wafer and method of forming the same Can Bayram, Christos D. Dimitrakopoulos, Jeehwan Kim, John A. Ott, Devendra K. Sadana 2017-02-21
9578736 Patterned metallization handle layer for controlled spalling Turki bin Saud bin Mohammed Al-Saud, Stephen W. Bedell, Paul A. Lauro, Devendra K. Sadana 2017-02-21
9570295 Protective capping layer for spalled gallium nitride Stephen W. Bedell, Paul A. Lauro, Devendra K. Sadana 2017-02-14
9564335 Method for improving quality of spalled material layers Stephen W. Bedell, Paul A. Lauro, Ning Li, Devendra K. Sadana, Katherine L. Saenger +1 more 2017-02-07
9536945 MOSFET with ultra low drain leakage Joel P. de Souza, Jeehwan Kim, Devendra K. Sadana 2017-01-03
9536736 Reducing substrate bowing caused by high percentage sige layers Stephen W. Bedell, Alexander Reznicek, Devendra K. Sadana 2017-01-03
9514995 Implant-free punch through doping layer formation for bulk FinFET structures Alexander Reznicek, Devendra K. Sadana, Dominic J. Schepis 2016-12-06
9508640 Multiple via structure and method Cheng-Wei Cheng, Szu-Lin Cheng, Edward W. Kiewra, Amlan Majumdar, Devendra K. Sadana +2 more 2016-11-29
9502540 Uniform height tall fins with varying silicon germanium concentrations Stephen W. Bedell, Bruce B. Doris, Alexander Reznicek 2016-11-22
9502278 Substrate holder assembly for controlled layer transfer Stephen W. Bedell, Paul A. Lauro, Devendra K. Sadana 2016-11-22
9502609 Simplified process for vertical LED manufacturing Stephen W. Bedell, Paul A. Lauro, Devendra K. Sadana 2016-11-22
9496186 Uniform height tall fins with varying silicon germanium concentrations Stephen W. Bedell, Bruce B. Doris, Alexander Reznicek 2016-11-15
9496401 III-V device structure with multiple threshold voltage Kangguo Cheng, Pouya Hashemi, Alexander Reznicek 2016-11-15