Issued Patents All Time
Showing 226–250 of 272 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7026249 | SiGe lattice engineering using a combination of oxidation, thinning and epitaxial regrowth | Stephen W. Bedell, Huajie Chen, Devendra K. Sadana | 2006-04-11 |
| 6991998 | Ultra-thin, high quality strained silicon-on-insulator formed by elastic strain transfer | Stephen W. Bedell, Anthony G. Domenicucci, Effendi Leobandung, Devendra K. Sadana | 2006-01-31 |
| 6989058 | Use of thin SOI to inhibit relaxation of SiGe layers | Stephen W. Bedell, Huajie Chen, Devendra K. Sadana | 2006-01-24 |
| 6946373 | Relaxed, low-defect SGOI for strained Si CMOS applications | Paul D. Agnello, Stephen W. Bedell, Robert H. Dennard, Anthony G. Domenicucci, Devendra K. Sadana | 2005-09-20 |
| 6891360 | Plated probe structure | Brian S. Beaman, Paul A. Lauro, Eugene J. O'Sullivan, Da-Yuan Shih, Ho-Ming Tong | 2005-05-10 |
| 6880245 | Method for fabricating a structure for making contact with an IC device | Brian S. Beaman, Paul A. Lauro, Maurice Heathcote Norcott, Da-Yuan Shih | 2005-04-19 |
| 6878611 | Patterned strained silicon for high performance circuits | Devendra K. Sadana, Stephen W. Bedell, Tze-Chiang Chen, Kwang Su Choe | 2005-04-12 |
| 6861158 | Formation of silicon-germanium-on-insulator (SGOI) by an integral high temperature SIMOX-Ge interdiffusion anneal | Stephen W. Bedell, Joel P. de Souza, Devendra K. Sadana, Ghavam G. Shahidi | 2005-03-01 |
| 6855436 | Formation of silicon-germanium-on-insulator (SGOI) by an integral high temperature SIMOX-Ge interdiffusion anneal | Stephen W. Bedell, Devendra K. Sadana, Ghavam G. Shahidi | 2005-02-15 |
| 6846727 | Patterned SOI by oxygen implantation and annealing | Mark C. Hakey, Steven J. Holmes, Devendra K. Sadana, Ghavam G. Shahidi | 2005-01-25 |
| 6841457 | Use of hydrogen implantation to improve material properties of silicon-germanium-on-insulator material made by thermal diffusion | Stephen W. Bedell, Devendra K. Sadana | 2005-01-11 |
| 6825102 | Method of improving the quality of defective semiconductor material | Stephen W. Bedell, Shreesh Narasimha, Devendra K. Sadana | 2004-11-30 |
| 6805962 | Method of creating high-quality relaxed SiGe-on-insulator for strained Si CMOS applications | Stephen W. Bedell, Jack O. Chu, Steven J. Koester, Devendra K. Sadana, John A. Ott | 2004-10-19 |
| 6803240 | Method of measuring crystal defects in thin Si/SiGe bilayers | Stephen W. Bedell, Devendra K. Sadana | 2004-10-12 |
| 6800518 | Formation of patterned silicon-on-insulator (SOI)/silicon-on-nothing (SON) composite structure by porous Si engineering | Robert E. Bendernagel, Kwang Su Choe, Bijan Davari, Devendra K. Sadana, Ghavam G. Shahidi +1 more | 2004-10-05 |
| 6722032 | Method of forming a structure for electronic devices contact locations | Brian S. Beaman, Paul A. Lauro, Maurice Heathcote Norcott, Da-Yuan Shih | 2004-04-20 |
| 6717217 | Ultimate SIMOX | Maurice Heathcote Norcott, Devendra K. Sadana | 2004-04-06 |
| 6708403 | Angled flying lead wire bonding process | Brian S. Beaman, Paul A. Lauro, Da-Yuan Shih | 2004-03-23 |
| 6541356 | Ultimate SIMOX | Maurice Heathcote Norcott, Devendra K. Sadana | 2003-04-01 |
| 6528984 | Integrated compliant probe for wafer level test and burn-in | Brian S. Beaman, Paul A. Lauro, Da-Yuan Shih | 2003-03-04 |
| 6526655 | Angled flying lead wire bonding process | Brian S. Beaman, Paul A. Lauro, Da-Yuan Shih | 2003-03-04 |
| 6523255 | Process and structure to repair damaged probes mounted on a space transformer | Da-Yuan Shih, Paul A. Lauro, Brian S. Beaman | 2003-02-25 |
| 6525551 | Probe structures for testing electrical interconnections to integrated circuit electronic devices | Brian S. Beaman, Paul A. Lauro, Eugene J. O'Sullivan, Da-Yuan Shih | 2003-02-25 |
| 6452406 | Probe structure having a plurality of discrete insulated probe tips | Brian S. Beaman, Paul A. Lauro, Yun-Hsin Liao, Daniel Peter Morris, Da-Yuan Shih | 2002-09-17 |
| 6334247 | High density integrated circuit apparatus, test probe and methods of use thereof | Brian S. Beaman, Paul A. Lauro, Maurice Heathcote Norcott, Da-Yuan Shih, George F. Walker | 2002-01-01 |