Issued Patents All Time
Showing 51–75 of 79 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5691540 | Assembly for measuring a trench depth parameter of a workpiece | Scott D. Halle, Philip Charles Danby Hobbs, Tadashi Mitsui, Theodore G. van Kessel | 1997-11-25 |
| 5646731 | Interferometric detecting/imaging method based on multi-pole sensing | Frederic Zenhausern, Yves Martin, Martin P. O'Boyle | 1997-07-08 |
| 5640242 | Assembly and method for making in process thin film thickness measurments | Martin P. O'Boyle, John Charles Panner, Thomas E. Sandwick, Theodore G. van Kessel | 1997-06-17 |
| 5624845 | Assembly and a method suitable for identifying a code | Frederic Zenhausern | 1997-04-29 |
| 5623338 | Interferometric near-field apparatus based on multi-pole sensing | Frederic Zenhausern, Yves Martin, Martin P. O'Boyle | 1997-04-22 |
| 5623339 | Interferometric measuring method based on multi-pole sensing | Frederic Zenhausern, Martin P. O'Boyle | 1997-04-22 |
| 5609744 | Assembly suitable for identifying a code sequence of a biomolecule in a gel embodiment | Frederic Zenharusern | 1997-03-11 |
| 5607568 | Assembly suitable for identifying a code sequence of a biomolecule in a free-solution embodiment | Frederic Zenharusern | 1997-03-04 |
| 5602820 | Method and apparatus for mass data storage | Frederic Zenhausern | 1997-02-11 |
| 5538898 | Method suitable for identifying a code sequence of a biomolecule | Frederic Zenhausern | 1996-07-23 |
| 5527110 | Method and apparatus for detecting asperities on magnetic disks using thermal proximity imaging | David W. Abraham, Anthony P. Praino, Mark E. Re | 1996-06-18 |
| 5392118 | Method for measuring a trench depth parameter of a material | — | 1995-02-21 |
| 5384639 | Depth measurement of high aspect ratio structures | — | 1995-01-24 |
| 5382795 | Ultrafine silicon tips for AFM/STM profilometry | Thomas Bayer, Johann Greschner, Yves Martin, Helga Weiss, Olaf Wolter | 1995-01-17 |
| 5347854 | Two dimensional profiling with a contact force atomic force microscope | Yves Martin | 1994-09-20 |
| 5298975 | Combined scanning force microscope and optical metrology tool | Henri A. Khoury, Calvin K. Chi, Joachim Clabes, Philip Charles Danby Hobbs, Laszlo Landstein +2 more | 1994-03-29 |
| 5283442 | Surface profiling using scanning force microscopy | Yves Martin, Jordan Poler | 1994-02-01 |
| 5280341 | Feedback controlled differential fiber interferometer | Martin Nonnenmacher, deceased, Mehdi Vaez=Iravani | 1994-01-18 |
| 5263776 | Multi-wavelength optical thermometry | David W. Abraham, William M. Holber, Joseph S. Logan | 1993-11-23 |
| 5260577 | Sample carriage for scanning probe microscope | David W. Abraham, James Michael Hammond, Martin Klos, Kenneth Gilbert Roessler, Robert Marshall Stowell | 1993-11-09 |
| 5242541 | Method of producing ultrafine silicon tips for the AFM/STM profilometry | Thomas Bayer, Johann Greschner, Yves Martin, Helga Weiss, Olaf Wolter | 1993-09-07 |
| 5065103 | Scanning capacitance - voltage microscopy | James A. Slinkman, Clayton C. Williams | 1991-11-12 |
| 5003815 | Atomic photo-absorption force microscope | Yves Martin | 1991-04-02 |
| 4992659 | Near-field lorentz force microscopy | David W. Abraham | 1991-02-12 |
| 4947034 | Apertureless near field optical microscope | Clayton C. Williams | 1990-08-07 |