Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6218264 | Method of producing a calibration standard for 2-D and 3-D profilometry in the sub-nanometer range | Johann W. Bartha, Thomas Bayer, Johann Greschner, Helga Weiss | 2001-04-17 |
| 5960255 | Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it | Johann W. Bartha, Thomas Bayer, Johann Greschner, Helga Weiss | 1999-09-28 |
| 5665905 | Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it | Johann W. Bartha, Thomas Bayer, Johann Greschner, Helga Weiss | 1997-09-09 |
| 5646339 | Force microscope and method for measuring atomic forces in multiple directions | Thomas Bayer, Johann Greschner | 1997-07-08 |
| 5534359 | Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it | Johann W. Bartha, Thomas Bayer, Johann Greschner, Helga Weiss | 1996-07-09 |
| 5283437 | Pneumatically and electrostatically driven scanning tunneling microscope | Johann Greschner, Olaf Wolter | 1994-02-01 |
| 5280341 | Feedback controlled differential fiber interferometer | Mehdi Vaez=Iravani, Hemantha K. Wickramasinghe | 1994-01-18 |