| 8039813 |
Charged particle-optical systems, methods and components |
Antonio Casares, Thomas Kemen, Rainer Knippelmeyer, Thomas Bayer, Georg Fritz +1 more |
2011-10-18 |
$35,517,000 |
| 6356089 |
Contact probe arrangement |
Thomas Bayer, Klaus Meissner, Werner Steiner, Roland Stoehr |
2002-03-12 |
$13,941,000 |
| 6218264 |
Method of producing a calibration standard for 2-D and 3-D profilometry in the sub-nanometer range |
Johann W. Bartha, Thomas Bayer, Martin Nonnenmacher, deceased, Helga Weiss |
2001-04-17 |
$20,042,000 |
| 6091124 |
Micromechanical sensor for AFM/STM profilometry |
Thomas Bayer, Helga Weiss |
2000-07-18 |
$26,569,000 |
| 6087199 |
Method for fabricating a very dense chip package |
H. Bernhard Pogge, Bijan Davari, Howard L. Kalter |
2000-07-11 |
$21,738,000 |
| 6088320 |
Micro-mechanically fabricated read/write head with a strengthening shell on the tip shaft |
Thomas Bayer, Helga Weiss |
2000-07-11 |
$21,738,000 |
| 6061074 |
Ion generator for ionographic print heads |
Johann W. Bartha, Frank Druschke, Gerhard Elsner |
2000-05-09 |
$23,540,000 |
| 6028008 |
Calibration standard for profilometers and manufacturing procedure |
Thomas Bayer, Klaus Meissner |
2000-02-22 |
$38,576,000 |
| 6004700 |
Membrane mask for electron beam lithography |
Samuel Kalt, Klaus Meissner, Rudolf Paul |
1999-12-21 |
$22,815,000 |
| 5998868 |
Very dense chip package |
H. Bernhard Pogge, Bijan Davari, Howard L. Kalter |
1999-12-07 |
$33,125,000 |
| 5960255 |
Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it |
Johann W. Bartha, Thomas Bayer, Martin Nonnenmacher, deceased, Helga Weiss |
1999-09-28 |
$25,907,000 |
| 5939893 |
Contact probe arrangement for functional electrical testing |
Gerhard Elsner, Roland Stoehr |
1999-08-17 |
$20,828,000 |
| 5935739 |
Manufacturing method for membrane lithography mask with mask fields |
Thomas Bayer, Samuel Kalt, Klaus Meissner, Hans C. Pfeiffer |
1999-08-10 |
$20,467,000 |
| 5866443 |
Very dense integrated circuit package and method for forming the same |
H. Bernhard Pogge, Howard L. Kalter, Raymond J. Rosner |
1999-02-02 |
$19,134,000 |
| 5863636 |
Adhesive bond for densely ordered elements |
Frank Druschke, Gerhard Elsner, Roland Stoehr |
1999-01-26 |
$21,368,000 |
| 5817581 |
Process for the creation of a thermal SiO.sub.2 layer with extremely uniform layer thickness |
Thomas Bayer, Klaus Meissner |
1998-10-06 |
$15,994,000 |
| 5817201 |
Method of fabricating a field emission device |
Peter Pleshko, Gerhard Schmid |
1998-10-06 |
$15,994,000 |
| 5814885 |
Very dense integrated circuit package |
H. Bernhard Pogge, Howard L. Kalter |
1998-09-29 |
$18,461,000 |
| 5791959 |
Method of fabricating a field emission device |
Johann W. Bartha, Volkhard Wolf |
1998-08-11 |
$8,339,000 |
| 5789666 |
Resonant sensor for determining multiple physical values |
Thomas Bayer, Gerhard Schmid, Volker Wolf |
1998-08-04 |
$10,071,000 |
| 5783905 |
Field emission device with series resistor tip and method of manufacturing |
Peter Pleshko, Gerhard Schmid |
1998-07-21 |
$12,143,000 |
| 5770884 |
Very dense integrated circuit package |
H. Bernhard Pogge, Howard L. Kalter, Raymond J. Rosner |
1998-06-23 |
$13,396,000 |
| 5717278 |
Field emission device and method for fabricating it |
Johann W. Bartha, Volkhard Wolf |
1998-02-10 |
$18,636,000 |
| 5707537 |
Bulk removal, transport and storage fixture for small batch-fabricated devices |
Johann W. Bartha, Klaus Meissner, Volkhard Wolf |
1998-01-13 |
$22,993,000 |
| 5665905 |
Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it |
Johann W. Bartha, Thomas Bayer, Martin Nonnenmacher, deceased, Helga Weiss |
1997-09-09 |
$15,735,000 |
