Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6356089 | Contact probe arrangement | Thomas Bayer, Johann Greschner, Klaus Meissner, Werner Steiner | 2002-03-12 |
| 6344751 | Finger tester probe | Manfred Prokopp | 2002-02-05 |
| 5939893 | Contact probe arrangement for functional electrical testing | Gerhard Elsner, Johann Greschner | 1999-08-17 |
| 5863636 | Adhesive bond for densely ordered elements | Frank Druschke, Gerhard Elsner, Johann Greschner | 1999-01-26 |
| 5532657 | High speed coaxial contact and signal transmission element | Rudolf Kratt | 1996-07-02 |
| 5488314 | Buckling beam test probe assembly | Wolfram Brandt, Bernd Marquart | 1996-01-30 |
| 5304278 | Apparatus for plasma or reactive ion etching and method of etching substrates having a low thermal conductivity | Johann W. Bartha, Thomas Bayer, Johann Greschner, Dieter Kern, Volker Mattern | 1994-04-19 |
| 5296091 | Method of etching substrates having a low thermal conductivity | Johann W. Bartha, Thomas Bayer, Johann Greschner, Dieter Kern, Volker Mattern | 1994-03-22 |
| 4908571 | Contact probe assembly with fine positioning means | — | 1990-03-13 |