Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11162781 | Interferometry systems and methods | — | 2021-11-02 |
| 11009341 | Interferometry system and associated methods | — | 2021-05-18 |
| 10514250 | Interferometry system and associated methods | — | 2019-12-24 |
| 10422630 | Interferometry system and associated methods | — | 2019-09-24 |
| 9052339 | Measurement of depth and energy of buried trap states in dielectric films by single electron tunneling force spectroscopy | Jon Paul Johnson | 2015-06-09 |
| 9052337 | Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopy | Jon Paul Johnson | 2015-06-09 |
| 8315819 | Method and apparatus for determining dopant density in semiconductor devices | — | 2012-11-20 |
| 7420106 | Scanning probe characterization of surfaces | Ezra Bussmann | 2008-09-02 |
| 6583412 | Scanning tunneling charge transfer microscope | — | 2003-06-24 |
| 6210982 | Method for improving spatial resolution and accuracy in scanning probe microscopy | Jeffrey S. McMurray | 2001-04-03 |
| 5969345 | Micromachined probes for nanometer scale measurements and methods of making such probes | Robert C. Davis, Pavel Neuzil | 1999-10-19 |
| 5523700 | Quantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopy | Yunji Huang | 1996-06-04 |
| 5065103 | Scanning capacitance - voltage microscopy | James A. Slinkman, Hemantha K. Wickramasinghe | 1991-11-12 |
| 5061070 | Particulate inspection of fluids using interferometric light measurements | John S. Batchelder, Donald M. DeCain, Marc A. Taubenblatt, Hermantha K. Wickramasinghe | 1991-10-29 |
| 4947034 | Apertureless near field optical microscope | Hemantha K. Wickramasinghe | 1990-08-07 |
| 4747698 | Scanning thermal profiler | Hermantha K. Wickramasinghe | 1988-05-31 |
| 4666308 | Method and apparatus for non-destructive testing using acoustic-optic laser probe | — | 1987-05-19 |