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Detection of road surface defects |
Timothy J. Chainer, Pritish R. Parida |
2021-10-12 |
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Photonic waveguide coupling using offset light source |
Russell A. Budd |
2020-04-07 |
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Photonic waveguide coupling using offset light source |
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2019-11-26 |
| 9912413 |
Electro-optic phase modulator with no residual amplitude modulation |
Nicolas Dupuis, Benjamin G. Lee |
2018-03-06 |
| 9735879 |
Near-threshold optical transmitter pre-distortion |
Fuad E. Doany, Daniel M. Kuchta, Jonathan E. Proesel, Alexander V. Rylyakov, Clint L. Schow |
2017-08-15 |
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Silicon photonics wafer using standard silicon-on-insulator processes through substrate removal or transfer |
Fuad E. Doany, Benjamin G. Lee, Alexander V. Rylyakov, Clint L. Schow |
2014-12-02 |
| 8125984 |
Method, system, and computer program product for implementing stream processing using a reconfigurable optical switch |
James R. Giles, Nagui Halim, Kirsten W. Hildrum, Daniel M. Kuchta, Yoonho Park +7 more |
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User configurable multivariate time series reduction tool control method |
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User configurable multivariate time series reduction tool control method |
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User configurable multivariate time series reduction tool control method |
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2002-08-27 |
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Downstream monitor for CMP brush cleaners |
Donald M. DeCain, Cuc K. Huynh, Robert A. Jurjevic, Douglas P. Nadeau |
1999-11-02 |
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Downstream monitor for CMP brush cleaners |
Donald M. DeCain, Cuc K. Huynh, Robert A. Jurjevic, Douglas P. Nadeau |
1998-11-10 |
| 5432607 |
Method and apparatus for inspecting patterned thin films using diffracted beam ellipsometry |
— |
1995-07-11 |
| 5343290 |
Surface particle detection using heterodyne interferometer |
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1994-08-30 |
| 5220403 |
Apparatus and a method for high numerical aperture microscopic examination of materials |
John S. Batchelder, Philip Charles Danby Hobbs |
1993-06-15 |
| 5208648 |
Apparatus and a method for high numerical aperture microscopic examination of materials |
John S. Batchelder, Philip Charles Danby Hobbs, Douglas W. Cooper |
1993-05-04 |
| 5177559 |
Dark field imaging defect inspection system for repetitive pattern integrated circuits |
John S. Batchelder |
1993-01-05 |
| 5133602 |
Particle path determination system |
John S. Batchelder, Donald M. DeCain, Philip Charles Danby Hobbs |
1992-07-28 |
| 5061070 |
Particulate inspection of fluids using interferometric light measurements |
John S. Batchelder, Donald M. DeCain, Hermantha K. Wickramasinghe, Clayton C. Williams |
1991-10-29 |
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Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field |
John S. Batchelder |
1991-08-06 |