MT

Marc A. Taubenblatt

IBM: 20 patents #5,451 of 70,183Top 8%
Overall (All Time): #221,486 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11145142 Detection of road surface defects Timothy J. Chainer, Pritish R. Parida 2021-10-12
10613279 Photonic waveguide coupling using offset light source Russell A. Budd 2020-04-07
10488605 Photonic waveguide coupling using offset light source Russell A. Budd 2019-11-26
9912413 Electro-optic phase modulator with no residual amplitude modulation Nicolas Dupuis, Benjamin G. Lee 2018-03-06
9735879 Near-threshold optical transmitter pre-distortion Fuad E. Doany, Daniel M. Kuchta, Jonathan E. Proesel, Alexander V. Rylyakov, Clint L. Schow 2017-08-15
8901576 Silicon photonics wafer using standard silicon-on-insulator processes through substrate removal or transfer Fuad E. Doany, Benjamin G. Lee, Alexander V. Rylyakov, Clint L. Schow 2014-12-02
8125984 Method, system, and computer program product for implementing stream processing using a reconfigurable optical switch James R. Giles, Nagui Halim, Kirsten W. Hildrum, Daniel M. Kuchta, Yoonho Park +7 more 2012-02-28
6678569 User configurable multivariate time series reduction tool control method Raymond Bunkofske, John Z. Colt, Jr., James J. McGill, Nancy T. Pascoe, Maheswaran Surendra +1 more 2004-01-13
6584368 User configurable multivariate time series reduction tool control method Raymond Bunkofske, John Z. Colt, Jr., James J. McGill, Nancy T. Pascoe, Maheswaran Surendra +1 more 2003-06-24
6442445 User configurable multivariate time series reduction tool control method Raymond Bunkofske, John Z. Colt, Jr., James J. McGill, Nancy T. Pascoe, Maheswaran Surendra +1 more 2002-08-27
5974868 Downstream monitor for CMP brush cleaners Donald M. DeCain, Cuc K. Huynh, Robert A. Jurjevic, Douglas P. Nadeau 1999-11-02
5834642 Downstream monitor for CMP brush cleaners Donald M. DeCain, Cuc K. Huynh, Robert A. Jurjevic, Douglas P. Nadeau 1998-11-10
5432607 Method and apparatus for inspecting patterned thin films using diffracted beam ellipsometry 1995-07-11
5343290 Surface particle detection using heterodyne interferometer John S. Batchelder, Donald M. DeCain, Philip Charles Danby Hobbs 1994-08-30
5220403 Apparatus and a method for high numerical aperture microscopic examination of materials John S. Batchelder, Philip Charles Danby Hobbs 1993-06-15
5208648 Apparatus and a method for high numerical aperture microscopic examination of materials John S. Batchelder, Philip Charles Danby Hobbs, Douglas W. Cooper 1993-05-04
5177559 Dark field imaging defect inspection system for repetitive pattern integrated circuits John S. Batchelder 1993-01-05
5133602 Particle path determination system John S. Batchelder, Donald M. DeCain, Philip Charles Danby Hobbs 1992-07-28
5061070 Particulate inspection of fluids using interferometric light measurements John S. Batchelder, Donald M. DeCain, Hermantha K. Wickramasinghe, Clayton C. Williams 1991-10-29
5037202 Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field John S. Batchelder 1991-08-06