Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11145142 | Detection of road surface defects | Timothy J. Chainer, Pritish R. Parida | 2021-10-12 |
| 10613279 | Photonic waveguide coupling using offset light source | Russell A. Budd | 2020-04-07 |
| 10488605 | Photonic waveguide coupling using offset light source | Russell A. Budd | 2019-11-26 |
| 9912413 | Electro-optic phase modulator with no residual amplitude modulation | Nicolas Dupuis, Benjamin G. Lee | 2018-03-06 |
| 9735879 | Near-threshold optical transmitter pre-distortion | Fuad E. Doany, Daniel M. Kuchta, Jonathan E. Proesel, Alexander V. Rylyakov, Clint L. Schow | 2017-08-15 |
| 8901576 | Silicon photonics wafer using standard silicon-on-insulator processes through substrate removal or transfer | Fuad E. Doany, Benjamin G. Lee, Alexander V. Rylyakov, Clint L. Schow | 2014-12-02 |
| 8125984 | Method, system, and computer program product for implementing stream processing using a reconfigurable optical switch | James R. Giles, Nagui Halim, Kirsten W. Hildrum, Daniel M. Kuchta, Yoonho Park +7 more | 2012-02-28 |
| 6678569 | User configurable multivariate time series reduction tool control method | Raymond Bunkofske, John Z. Colt, Jr., James J. McGill, Nancy T. Pascoe, Maheswaran Surendra +1 more | 2004-01-13 |
| 6584368 | User configurable multivariate time series reduction tool control method | Raymond Bunkofske, John Z. Colt, Jr., James J. McGill, Nancy T. Pascoe, Maheswaran Surendra +1 more | 2003-06-24 |
| 6442445 | User configurable multivariate time series reduction tool control method | Raymond Bunkofske, John Z. Colt, Jr., James J. McGill, Nancy T. Pascoe, Maheswaran Surendra +1 more | 2002-08-27 |
| 5974868 | Downstream monitor for CMP brush cleaners | Donald M. DeCain, Cuc K. Huynh, Robert A. Jurjevic, Douglas P. Nadeau | 1999-11-02 |
| 5834642 | Downstream monitor for CMP brush cleaners | Donald M. DeCain, Cuc K. Huynh, Robert A. Jurjevic, Douglas P. Nadeau | 1998-11-10 |
| 5432607 | Method and apparatus for inspecting patterned thin films using diffracted beam ellipsometry | — | 1995-07-11 |
| 5343290 | Surface particle detection using heterodyne interferometer | John S. Batchelder, Donald M. DeCain, Philip Charles Danby Hobbs | 1994-08-30 |
| 5220403 | Apparatus and a method for high numerical aperture microscopic examination of materials | John S. Batchelder, Philip Charles Danby Hobbs | 1993-06-15 |
| 5208648 | Apparatus and a method for high numerical aperture microscopic examination of materials | John S. Batchelder, Philip Charles Danby Hobbs, Douglas W. Cooper | 1993-05-04 |
| 5177559 | Dark field imaging defect inspection system for repetitive pattern integrated circuits | John S. Batchelder | 1993-01-05 |
| 5133602 | Particle path determination system | John S. Batchelder, Donald M. DeCain, Philip Charles Danby Hobbs | 1992-07-28 |
| 5061070 | Particulate inspection of fluids using interferometric light measurements | John S. Batchelder, Donald M. DeCain, Hermantha K. Wickramasinghe, Clayton C. Williams | 1991-10-29 |
| 5037202 | Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field | John S. Batchelder | 1991-08-06 |