| 5884691 |
Fluid transmissive moderated flow resistance heat transfer unit |
— |
1999-03-23 |
| 5860472 |
Fluid transmissive apparatus for heat transfer |
— |
1999-01-19 |
| 5823249 |
Manifold for controlling interdigitated counterstreaming fluid flows |
— |
1998-10-20 |
| 5432670 |
Generation of ionized air for semiconductor chips |
Vaughn P. Gross, Robert A. Gruver, Philip Charles Danby Hobbs, Kenneth D. Murray |
1995-07-11 |
| 5402351 |
Model generation system having closed-loop extrusion nozzle positioning |
Huntington W. Curtis, Douglas S. Goodman, Franklin Gracer, Robert R. Jackson, George M. Koppelman +1 more |
1995-03-28 |
| 5343290 |
Surface particle detection using heterodyne interferometer |
Donald M. DeCain, Philip Charles Danby Hobbs, Marc A. Taubenblatt |
1994-08-30 |
| 5316970 |
Generation of ionized air for semiconductor chips |
Vaughn P. Gross, Robert A. Gruver, Philip Charles Danby Hobbs, Kenneth D. Murray |
1994-05-31 |
| 5312224 |
Conical logarithmic spiral viscosity pump |
Shawn A. Hall, Robert R. Jackson |
1994-05-17 |
| 5303141 |
Model generation system having closed-loop extrusion nozzle positioning |
Huntington W. Curtis, Douglas S. Goodman, Franklin Gracer, Robert R. Jackson, George M. Koppelman +1 more |
1994-04-12 |
| 5294806 |
Optical submicron aerosol particle detector |
Donald M. DeCain, Philip Charles Danby Hobbs |
1994-03-15 |
| 5220403 |
Apparatus and a method for high numerical aperture microscopic examination of materials |
Philip Charles Danby Hobbs, Marc A. Taubenblatt |
1993-06-15 |
| 5208648 |
Apparatus and a method for high numerical aperture microscopic examination of materials |
Philip Charles Danby Hobbs, Marc A. Taubenblatt, Douglas W. Cooper |
1993-05-04 |
| 5192870 |
Optical submicron aerosol particle detector |
Donald M. DeCain, Philip Charles Danby Hobbs |
1993-03-09 |
| 5177559 |
Dark field imaging defect inspection system for repetitive pattern integrated circuits |
Marc A. Taubenblatt |
1993-01-05 |
| 5158690 |
Thermophoretic filtering of liquids |
Douglas W. Cooper, Donald M. DeCain, Walter W. Hildenbrand |
1992-10-27 |
| 5133602 |
Particle path determination system |
Donald M. DeCain, Philip Charles Danby Hobbs, Marc A. Taubenblatt |
1992-07-28 |
| 5116583 |
Suppression of particle generation in a modified clean room corona air ionizer |
Vaughn P. Gross, Philip Charles Danby Hobbs, Robert J. Miller, Kenneth D. Murray |
1992-05-26 |
| 5061070 |
Particulate inspection of fluids using interferometric light measurements |
Donald M. DeCain, Marc A. Taubenblatt, Hermantha K. Wickramasinghe, Clayton C. Williams |
1991-10-29 |
| 5037202 |
Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field |
Marc A. Taubenblatt |
1991-08-06 |
| 4969198 |
System for automatic inspection of periodic patterns |
Raymond E. Bonner, Byron Edward Dom, Robert S. Jaffe |
1990-11-06 |
| 4771468 |
System for automatic inspection of periodic patterns |
Raymond E. Bonner, Byron Edward Dom, Robert S. Jaffe |
1988-09-13 |
| 4740708 |
Semiconductor wafer surface inspection apparatus and method |
— |
1988-04-26 |
