Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9052337 | Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopy | Clayton C. Williams | 2015-06-09 |
| 9052339 | Measurement of depth and energy of buried trap states in dielectric films by single electron tunneling force spectroscopy | Clayton C. Williams | 2015-06-09 |