Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5523700 | Quantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopy | Clayton C. Williams | 1996-06-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5523700 | Quantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopy | Clayton C. Williams | 1996-06-04 |