JH

James Michael Hammond

IBM: 17 patents #6,502 of 70,183Top 10%
Overall (All Time): #280,151 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6318159 Scanning force microscope with automatic surface engagement Dong Chen, Edwin Flecha, Kenneth Gilbert Roessler 2001-11-20
6234009 Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surface Dong Chen, Edwin Flecha, Kenneth Gilbert Roessler 2001-05-22
6220084 Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope Dong Chen, Edwin Flecha, Kenneth Gilbert Roessler 2001-04-24
6169281 Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions Dong Chen, Edwin Flecha, Yves Martin, Kenneth Gilbert Roessler 2001-01-02
6167753 Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope Dong Chen, Edwin Flecha, Kenneth Gilbert Roessler 2001-01-02
6093930 Automatic probe replacement in a scanning probe microscope James Boyette, Salvatore R. Riggio, Jr., Michael Servedio 2000-07-25
6079254 Scanning force microscope with automatic surface engagement and improved amplitude demodulation Dong Chen, Edwin Flecha, Kenneth Gilbert Roessler 2000-06-27
5918274 Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope Dong Chen, Edwin Flecha, Kenneth Gilbert Roessler 1999-06-29
5902928 Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator Dong Chen, Edwin Flecha, Kenneth Gilbert Roessler 1999-05-11
5804982 Miniature probe positioning actuator Jiann-Chang Lo, Michael Servedio 1998-09-08
5635848 Method and system for controlling high-speed probe actuators James C. Mahlbacher, Kenneth Gilbert Roessler, Michael Servedio, Li-Cheng Richard Zai 1997-06-03
5635849 Miniature probe positioning actuator Jiann-Chang Lo, Michael Servedio, James Boyette, Hans-George H. Kolan 1997-06-03
5550483 High speed test probe positioning system James Boyette, Jiann-Chang Lo, James C. Mahlbacher, Michael Servedio, Ali Reza Taheri 1996-08-27
5532611 Miniature probe positioning actuator Jiann-Chang Lo, Michael Servedio, James Boyette, Hans-George H. Kolan 1996-07-02
5360974 Dual quad flexure scanner Martin Klos, Yves Martin, Kenneth Gilbert Roessler, Robert Marshall Stowell 1994-11-01
5262643 Automatic tip approach method and apparatus for scanning probe microscope Martin Klos, Yves Martin, Kenneth Gilbert Roessler, Robert Marshall Stowell 1993-11-16
5260577 Sample carriage for scanning probe microscope David W. Abraham, Martin Klos, Kenneth Gilbert Roessler, Robert Marshall Stowell, Hemantha K. Wickramasinghe 1993-11-09