Issued Patents All Time
Showing 25 most recent of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11964310 | Debris removal from high aspect structures | Tod Evan Robinson, Bernabe J. Arruza, David Brinkley, Jeffrey E. LeClaire | 2024-04-23 |
| 11577286 | Debris removal in high aspect structures | Tod Evan Robinson, Bernabe J. Arruza, David Brinkley, Jeffrey E. LeClaire | 2023-02-14 |
| 11391664 | Debris removal from high aspect structures | Tod Evan Robinson, Bernabe J. Arruza, David Brinkley, Jeffrey E. LeClaire | 2022-07-19 |
| 11311917 | Apparatus and method for contamination identification | Jeffrey E. LeClaire, David Brinkley, Alexander M. Figliolini | 2022-04-26 |
| 11040379 | Debris removal in high aspect structures | Tod Evan Robinson, Bernabe J. Arruza, David Brinkley, Jeffrey E. LeClaire | 2021-06-22 |
| 10384238 | Debris removal in high aspect structures | Tod Evan Robinson, Bernabe J. Arruza, David Brinkley, Jeffrey E. LeClaire | 2019-08-20 |
| 10330581 | Debris removal from high aspect structures | Tod Evan Robinson, Bernabe J. Arruza, David Brinkley, Jeffrey E. LeClaire | 2019-06-25 |
| 9588420 | Apparatus and method for indirect surface cleaning | Jeffrey E. LeClaire, David Brinkley | 2017-03-07 |
| 9285674 | Apparatus and method for indirect surface cleaning | Jeffrey E. LeClaire, David Brinkley | 2016-03-15 |
| 8986460 | Apparatus and method for indirect surface cleaning | Jeffrey E. LeClaire, David Brinkley | 2015-03-24 |
| 8741067 | Apparatus and method for indirect surface cleaning | Jeffrey E. LeClaire, David Brinkley | 2014-06-03 |
| 8696818 | Debris removal in high aspect structures | Tod Evan Robinson, Bernabe J. Arruza | 2014-04-15 |
| 8613803 | Apparatus and method for indirect surface cleaning | Jeffrey E. LeClaire, David Brinkley | 2013-12-24 |
| 8562749 | Wafer fabrication process | Jeffrey E. LeClaire, David Brinkley | 2013-10-22 |
| 8293019 | Apparatus and method for indirect surface cleaning | Jeffrey E. LeClaire, David Brinkley | 2012-10-23 |
| 8287653 | Debris removal in high aspect structures | Tod Evan Robinson, Bernabe J. Arruza | 2012-10-16 |
| 8182609 | Apparatus and method for direct surface cleaning | Jeffrey E. Le Claire, David Brinkley | 2012-05-22 |
| 7993464 | Apparatus and method for indirect surface cleaning | Jeffrey E. LeClaire, David Brinkley | 2011-08-09 |
| 7829360 | Vertical indent production repair | Bernabe J. Arruza, Ronald Bozak, Andrew Dinsdale, Tod Evan Robinson, David Brinkley | 2010-11-09 |
| 7547882 | Scan data collection for better overall data accurancy | Dong Chen | 2009-06-16 |
| 7053369 | Scan data collection for better overall data accuracy | Dong Chen | 2006-05-30 |
| 6318159 | Scanning force microscope with automatic surface engagement | Dong Chen, Edwin Flecha, James Michael Hammond | 2001-11-20 |
| 6234009 | Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surface | Dong Chen, Edwin Flecha, James Michael Hammond | 2001-05-22 |
| 6220084 | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Dong Chen, Edwin Flecha, James Michael Hammond | 2001-04-24 |
| 6169281 | Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions | Dong Chen, Edwin Flecha, James Michael Hammond, Yves Martin | 2001-01-02 |