Edwin Flecha — 11 Patents at IBM

Edwin Flecha has been granted 11 US patents while listed as an inventor at IBM. The first was granted in 1995 and the most recent in November 2001. Edwin Flecha ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Edwin Flecha in Boca Raton, FL, US.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6318159	Scanning force microscope with automatic surface engagement	Dong Chen, James Michael Hammond, Kenneth Gilbert Roessler	2001-11-20	$26,885,000
6234009	Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surface	Dong Chen, James Michael Hammond, Kenneth Gilbert Roessler	2001-05-22	$28,959,000
6220084	Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope	Dong Chen, James Michael Hammond, Kenneth Gilbert Roessler	2001-04-24	$20,927,000
6167753	Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope	Dong Chen, James Michael Hammond, Kenneth Gilbert Roessler	2001-01-02	$72,115,000
6169281	Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions	Dong Chen, James Michael Hammond, Yves Martin, Kenneth Gilbert Roessler	2001-01-02	$72,115,000
6079254	Scanning force microscope with automatic surface engagement and improved amplitude demodulation	Dong Chen, James Michael Hammond, Kenneth Gilbert Roessler	2000-06-27	$38,700,000
5918274	Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope	Dong Chen, James Michael Hammond, Kenneth Gilbert Roessler	1999-06-29	$36,828,000
5902928	Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator	Dong Chen, James Michael Hammond, Kenneth Gilbert Roessler	1999-05-11	$48,739,000
5801381	Method for protecting a probe tip using active lateral scanning control	Kenneth Gilbert Roessler, Robert Marshall Stowell	1998-09-01	$8,247,000
5773824	Method for improving measurement accuracy using active lateral scanning control of a probe	Martin Klos, Kenneth Gilbert Roessler, Robert Marshall Stowell	1998-06-30	$9,812,000
5432460	Apparatus and method for opens and shorts testing of a circuit board	Kelvin D. Henry, James C. Mahlbacher, Michael Servedio, Kenneth S. Weinaug	1995-07-11	$10,611,000

Edwin Flecha — 11 Patents

Issued Patents All Time

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