Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12109420 | Systems and methods for optimized waveform generation | Anahita Kyani, Jagatkumar Shah, Douglas Alfred Lautner, Simeng Zhang, Yagna Pathak +2 more | 2024-10-08 |
| 5926266 | Optical apparatus for rapid defect analysis | Alan Dorundo, Michael G. Lisanke, Huizong Lu, Richard McCormick, Lanphuong Thi Pena +1 more | 1999-07-20 |
| 5822211 | Laser texturing apparatus with dual laser paths having an independently adjusted parameter | Michael Barenboim, Peter Michael Baumgart, Peter P. Chrusch, Benny Michael Harper, Benjamin Kami +7 more | 1998-10-13 |
| 5784163 | Optical differential profile measurement apparatus and process | Huizong Lu | 1998-07-21 |
| 5710631 | Apparatus and method for storing interferometric images of scanned defects and for subsequent static analysis of such defects | Akram Bou-Ghannam, Alan Dorundo, Michael G. Lisanke, Huizong Lu, Lanphuong Thi Pena +3 more | 1998-01-20 |
| 5703684 | Apparatus for optical differential measurement of glide height above a magnetic disk | Huizong Lu | 1997-12-30 |
| 5699160 | Optical apparatus for inspecting laser texture | Michael Barenboim, Peter Michael Baumgart, Peter P. Chrusch, Benny Michael Harper, Benjamin Karni +6 more | 1997-12-16 |
| 5550483 | High speed test probe positioning system | James Boyette, James Michael Hammond, Jiann-Chang Lo, James C. Mahlbacher, Michael Servedio | 1996-08-27 |