EW

Eric J. White

IBM: 59 patents #1,342 of 70,183Top 2%
Globalfoundries: 5 patents #673 of 4,424Top 20%
SA Siemens Aktiengesellschaft: 2 patents #6,658 of 22,248Top 30%
📍 Vergennes, VT: #2 of 133 inventorsTop 2%
🗺 Vermont: #92 of 4,968 inventorsTop 2%
Overall (All Time): #34,833 of 4,157,543Top 1%
64
Patents All Time

Issued Patents All Time

Showing 51–64 of 64 patents

Patent #TitleCo-InventorsDate
6340601 Method for reworking copper metallurgy in semiconductor devices Thomas F. Curran, Timothy C. Krywanczyk, Michael S. Lube, Matthew D. Moon, Rock Nadeau +6 more 2002-01-22
6294105 Chemical mechanical polishing slurry and method for polishing metal/oxide layers Paul M. Feeney, Timothy C. Krywanczyk, Lawrence D. David, Matthew T. Tiersch 2001-09-25
6251775 Self-aligned copper silicide formation for improved adhesion/electromigration Douglas S. Armbrust, Margaret L. Gibson, Laura Serianni 2001-06-26
6186873 Wafer edge cleaning Kent R. Becker, Stuart D. Cheney, Scott R. Cline, Paul A. Manfredi 2001-02-13
6063687 Formation of trench isolation for active areas and first level conductors Edward W. Sengle, Mark D. Jaffe, Daniel N. Maynard, Mark A. Lavin, John A. Bracchitta 2000-05-16
5734192 Trench isolation for active areas and first level conductors Edward W. Sengle, Mark D. Jaffe, Daniel N. Maynard, Mark A. Lavin, John A. Bracchitta 1998-03-31
5666000 Microcavity capacitive device Michael S. Dusablon 1997-09-09
5665655 Process for producing crackstops on semiconductor devices and devices containing the crackstops 1997-09-09
5576246 Personalized area leadframe coining or half etching for reduced mechanical stress at device edge Harold W. Conru, Francis E. Froebel, Albert J. Gregoritsch, Jr., Sheldon C. Rieley, Stephen G. Starr +2 more 1996-11-19
5545921 Personalized area leadframe coining or half etching for reduced mechanical stress at device edge Harold W. Conru, Francis E. Froebel, Albert J. Gregoritsch, Jr., Sheldon C. Rieley, Stephen G. Starr +2 more 1996-08-13
5530280 Process for producing crackstops on semiconductor devices and devices containing the crackstops 1996-06-25
5514832 Microcavity structures, fabrication processes, and applications thereof Michael S. Dusablon 1996-05-07
5508234 Microcavity structures, fabrication processes, and applications thereof Michael S. Dusablon 1996-04-16
5294570 Reduction of foreign particulate matter on semiconductor wafers Marshall J. Fleming, Jr., William A. Syverson 1994-03-15