| 7094614 |
In-situ monitoring of chemical vapor deposition process by mass spectrometry |
John Baker, Arne Ballantine, Roger W. Cheek, Doreen D. DiMilia, Mark L. Reath +1 more |
2006-08-22 |
| 6818992 |
Self-aligned copper silicide formation for improved adhesion/electromigration |
Margaret L. Gibson, Laura Serianni, Eric J. White |
2004-11-16 |
| 6773952 |
Semiconductor chip structures with embedded thermal conductors and a thermal sink disposed over opposing substrate surfaces |
William F. Clark, Jr., William A. Klaasen, William T. Motsiff, Timothy D. Sullivan |
2004-08-10 |
| 6610607 |
Method to define and tailor process limited lithographic features using a modified hard mask process |
Dale W. Martin, Jed H. Rankin, Sylvia Tousley |
2003-08-26 |
| 6512292 |
Semiconductor chip structures with embedded thermal conductors and a thermal sink disposed over opposing substrate surfaces |
William F. Clark, Jr., William A. Klaasen, William T. Motsiff, Timothy D. Sullivan |
2003-01-28 |
| 6251775 |
Self-aligned copper silicide formation for improved adhesion/electromigration |
Margaret L. Gibson, Laura Serianni, Eric J. White |
2001-06-26 |