Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7094614 | In-situ monitoring of chemical vapor deposition process by mass spectrometry | John Baker, Arne Ballantine, Roger W. Cheek, Doreen D. DiMilia, Mark L. Reath +1 more | 2006-08-22 |
| 6818992 | Self-aligned copper silicide formation for improved adhesion/electromigration | Margaret L. Gibson, Laura Serianni, Eric J. White | 2004-11-16 |
| 6773952 | Semiconductor chip structures with embedded thermal conductors and a thermal sink disposed over opposing substrate surfaces | William F. Clark, Jr., William A. Klaasen, William T. Motsiff, Timothy D. Sullivan | 2004-08-10 |
| 6610607 | Method to define and tailor process limited lithographic features using a modified hard mask process | Dale W. Martin, Jed H. Rankin, Sylvia Tousley | 2003-08-26 |
| 6512292 | Semiconductor chip structures with embedded thermal conductors and a thermal sink disposed over opposing substrate surfaces | William F. Clark, Jr., William A. Klaasen, William T. Motsiff, Timothy D. Sullivan | 2003-01-28 |
| 6251775 | Self-aligned copper silicide formation for improved adhesion/electromigration | Margaret L. Gibson, Laura Serianni, Eric J. White | 2001-06-26 |