Issued Patents All Time
Showing 26–50 of 56 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9036959 | Intergrating a silicon photonics photodetector with CMOS devices | Solomon Assefa, Marwan H. Khater, Steven M. Shank | 2015-05-19 |
| 8895352 | Method to improve nucleation of materials on graphene and carbon nanotubes | Katherina Babich, Alessandro C. Callegari, Zhihong Chen, Yanning Sun | 2014-11-25 |
| 8835266 | Method and structure for compound semiconductor contact | Norma E. Sosa Cortes, Masaharu Kobayashi, Kuen-Ting Shiu | 2014-09-16 |
| 8816333 | Method to improve nucleation of materials on graphene and carbon nanotubes | Katherina Babich, Alessandro C. Callegari, Zhihong Chen, Yanning Sun | 2014-08-26 |
| 8809860 | III-V compound semiconductor material passivation with crystalline interlayer | Kuen-Ting Shiu, Dechao Guo, Shu-Jen Han, Masaharu Kobayashi | 2014-08-19 |
| 8610172 | FETs with hybrid channel materials | Dechao Guo, Shu-Jen Han, Kuen-Ting Shiu | 2013-12-17 |
| 8524614 | III-V compound semiconductor material passivation with crystalline interlayer | Kuen-Ting Shiu, Dechao Guo, Shu-Jen Han, Masaharu Kobayashi | 2013-09-03 |
| 8525169 | Reliable physical unclonable function for device authentication | Daniel C. Edelstein, Stephen M. Gates, Satyanarayana V. Nitta, Ramachandran Muralidhar, Dirk Pfeiffer | 2013-09-03 |
| 8525290 | Method of forming memory cell access device | Erh-Kun Lai, Hsiang-Lan Lung | 2013-09-03 |
| 8431476 | Method to prevent surface decomposition of III-V compound semiconductors | Joel P. de Souza, Keith E. Fogel, Steven J. Koester, Christopher C. Parks, Devendra K. Sadana +1 more | 2013-04-30 |
| 8415772 | Method to prevent surface decomposition of III-V compound semiconductors | Joel P. de Souza, Keith E. Fogel, Steven J. Koester, Christopher C. Parks, Devendra K. Sadana +1 more | 2013-04-09 |
| 8273649 | Method to prevent surface decomposition of III-V compound semiconductors | Joel P. de Souza, Keith E. Fogel, Steven J. Koester, Christopher C. Parks, Devendra K. Sadana +1 more | 2012-09-25 |
| 7964896 | Buried channel MOSFET using III-V compound semiconductors and high k gate dielectrics | Steven J. Koester, Devendra K. Sadana, Ghavam G. Shahidi, Yanning Sun | 2011-06-21 |
| 7674675 | Method of forming an integrated SOI fingered decoupling capacitor | Zachary E. Berndlmaier, Carl Radens, William R. Tonti | 2010-03-09 |
| 7560375 | Gas dielectric structure forming methods | Ronald G. Filippi, Roy Iggulden, Ping-Chuan Wang | 2009-07-14 |
| 7473636 | Method to improve time dependent dielectric breakdown | Kaushik Chanda, James J. Demarest, Ronald G. Filippi, Roy Iggulden, Vincent J. McGahay +2 more | 2009-01-06 |
| 7361584 | Detection of residual liner materials after polishing in damascene process | Ronald G. Filippi, Roy Iggulden, Stephen K. Loh, Ping-Chuan Wang | 2008-04-22 |
| 7287325 | Method of forming interconnect structure or interconnect and via structures using post chemical mechanical polishing | Kaushik Chanda, James J. Demarest, Ronald G. Filippi, Roy Iggulden, Ping-Chuan Wang +1 more | 2007-10-30 |
| 7129557 | Autonomic thermal monitor and controller for thin film devices | Zachary E. Berndlmaier, Carl Radens, William R. Tonti | 2006-10-31 |
| 7119545 | Capacitive monitors for detecting metal extrusion during electromigration | Ishtiaq Ahsan, Ronald G. Filippi, Roy Iggulden, Ping-Chuan Wang | 2006-10-10 |
| 7102204 | Integrated SOI fingered decoupling capacitor | Zachary E. Berndlmaier, Carl Radens, William R. Tonti | 2006-09-05 |
| 7078259 | Method for integrating thermistor | Jon A. Casey, William J. Ferrante, Carl Radens, William R. Tonti | 2006-07-18 |
| 6566238 | Metal wire fuse structure with cavity | Axel Brintzinger, Chandrasekhar Narayan, Carl Radens | 2003-05-20 |
| 6486526 | Crack stop between neighboring fuses for protection from fuse blow damage | Chandrasekhar Narayan, Carl Radens, Axel Brintzinger | 2002-11-26 |
| 6444565 | Dual-rie structure for via/line interconnections | Christopher Adam Feild, Roy Iggulden, Rajiv V. Joshi | 2002-09-03 |