Issued Patents All Time
Showing 51–75 of 124 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9536926 | Magnetic tunnel junction based anti-fuses with cascoded transistors | Anthony J. Annunziata, John K. DeBrosse | 2017-01-03 |
| 9495627 | Magnetic tunnel junction based chip identification | Anthony J. Annunziata, Philip L. Trouilloud | 2016-11-15 |
| 9476927 | Structure and method to determine through silicon via build integrity | Troy L. Graves-Abe, Conal E. Murray | 2016-10-25 |
| 9436845 | Physically unclonable fuse using a NOR type memory array | Subramanian S. Iyer, Toshiaki Kirihata, Derek H. Leu, Sami Rosenblatt | 2016-09-06 |
| 9404953 | Structures and methods for monitoring dielectric reliability with through-silicon vias | Fen Chen, Mukta G. Farooq, John A. Griesemer, John M. Safran, Timothy D. Sullivan | 2016-08-02 |
| 9397287 | Magnetic tunnel junction with post-deposition hydrogenation | Anthony J. Annunziata, Gen P. Lauer | 2016-07-19 |
| 9298950 | Undiscoverable physical chip identification | Daniel Jacob Fainstein | 2016-03-29 |
| 9208878 | Non-volatile memory based on retention modulation | Subramanian S. Iyer, Toshiaki Kirihata | 2015-12-08 |
| 9184129 | Three-terminal antifuse structure having integrated heating elements for a programmable circuit | Byeongju Park, Subramanian S. Iyer | 2015-11-10 |
| 9177923 | Through-substrate via shielding | Daeik Daniel Kim, Chung-Hsun Lin, John M. Safran | 2015-11-03 |
| 9070698 | Through-substrate via shielding | Daeik Daniel Kim, Chung-Hsun Lin, John M. Safran | 2015-06-30 |
| 9025386 | Embedded charge trap multi-time-programmable-read-only-memory for high performance logic technology | Subramanian S. Iyer, Toshiaki Kirihata, Derek H. Leu, Dan Moy | 2015-05-05 |
| 8975910 | Through-silicon-via with sacrificial dielectric line | Troy L. Graves-Abe, Benjamin Himmel, Norman W. Robson | 2015-03-10 |
| 8950008 | Undiscoverable physical chip identification | Daniel Jacob Fainstein | 2015-02-03 |
| 8927427 | Anticipatory implant for TSV | Troy L. Graves-Abe, Brian J. Greene | 2015-01-06 |
| 8907410 | TSV structure with a built-in U-shaped FET transistor for improved characterization | Sami Rosenblatt, Geng Wang | 2014-12-09 |
| 8629049 | Electrically programmable fuse using anisometric contacts and fabrication method | Dan Moy, Norman W. Robson, John M. Safran | 2014-01-14 |
| 8629009 | Programmable high-k/metal gate memory device | Roger A. Booth, Jr., Kangguo Cheng, Chengwen Pei | 2014-01-14 |
| 8569755 | Secure anti-fuse with low voltage programming through localized diffusion heating | Yan Li, Dan Moy, Norman W. Robson, John M. Safran | 2013-10-29 |
| 8525263 | Programmable high-k/metal gate memory device | Roger A. Booth, Jr., Kangguo Cheng, Chengwen Pei | 2013-09-03 |
| 8519507 | Electrically programmable fuse using anisometric contacts and fabrication method | Dan Moy, Norman W. Robson, John M. Safran | 2013-08-27 |
| 8415653 | Single mask adder phase change memory element | Matthew J. Breitwisch, Chung H. Lam | 2013-04-09 |
| 8384145 | Non-volatile memory device using hot-carrier injection | Roger A. Booth, Jr., Kangguo Cheng, Chengwen Pei | 2013-02-26 |
| 8350264 | Secure anti-fuse with low voltage programming through localized diffusion heating | Yan Li, Dan Moy, Norman W. Robson, John M. Safran | 2013-01-08 |
| 8299570 | Efuse containing sige stack | Deok-kee Kim, Dureseti Chidambarrao, William K. Henson | 2012-10-30 |