GL

Gen P. Lauer

IBM: 45 patents #1,982 of 70,183Top 3%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
TL Tokyo Electron Limited: 1 patents #3,538 of 5,567Top 65%
Samsung: 1 patents #49,284 of 75,807Top 70%
Overall (All Time): #58,515 of 4,157,543Top 2%
48
Patents All Time

Issued Patents All Time

Showing 25 most recent of 48 patents

Patent #TitleCo-InventorsDate
11011698 Enhanced coercivity in MTJ devices by contact depth control Anthony J. Annunziata, Nathan P. Marchack 2021-05-18
10497862 Enhanced coercivity in MTJ devices by contact depth control Anthony J. Annunziata, Nathan P. Marchack 2019-12-03
10388857 Spin torque MRAM fabrication using negative tone lithography and ion beam etching Anthony J. Annunziata, Armand A. Galan, Steve Holmes, Eric A. Joseph, Qinghuang Lin +1 more 2019-08-20
10256397 Structure and method to reduce shorting and process degradation in stt-MRAM devices Anthony J. Annunziata, Janusz J. Nowak, Eugene J. O'Sullivan 2019-04-09
10243138 Structure and method to reduce shorting and process degradation in STT-MRAM devices Anthony J. Annunziata, Janusz J. Nowak, Eugene J. O'Sullivan 2019-03-26
10170698 Spin torque MRAM fabrication using negative tone lithography and ion beam etching Anthony J. Annunziata, Armand A. Galan, Steve Holmes, Eric A. Joseph, Qinghuang Lin +1 more 2019-01-01
10170609 Internal spacer formation from selective oxidation for Fin-first wire-last replacement gate-all-around nanowire FET Szu-Lin Cheng, Michael A. Guillorn, Isaac Lauer 2019-01-01
10170608 Internal spacer formation from selective oxidation for fin-first wire-last replacement gate-all-around nanowire FET Szu-Lin Cheng, Michael A. Guillorn, Isaac Lauer 2019-01-01
10084127 Enhanced coercivity in MTJ devices by contact depth control Anthony J. Annunziata, Nathan P. Marchack 2018-09-25
9960347 Structure and method to reduce shorting and process degradation in STT-MRAM devices Anthony J. Annunziata, Janusz J. Nowak, Eugene J. O'Sullivan 2018-05-01
9954063 Stacked planar double-gate lamellar field-effect transistor Josephine B. Chang, Michael A. Guillorn, Isaac Lauer, Jeffrey W. Sleight 2018-04-24
9954062 Stacked planar double-gate lamellar field-effect transistor Josephine B. Chang, Michael A. Guillorn, Isaac Lauer, Jeffrey W. Sleight 2018-04-24
9947863 Structure and method to reduce shorting in STT-MRAM device Anthony J. Annunziata, Nathan P. Marchack 2018-04-17
9859375 Stacked planar double-gate lamellar field-effect transistor Josephine B. Chang, Michael A. Guillorn, Isaac Lauer, Jeffrey W. Sleight 2018-01-02
9853210 Reduced process degradation of spin torque magnetoresistive random access memory Anthony J. Annunziata, Nathan P. Marchack, Stephen M. Rossnagel 2017-12-26
9812370 III-V, SiGe, or Ge base lateral bipolar transistor and CMOS hybrid technology Josephine B. Chang, Isaac Lauer, Jeffrey W. Sleight 2017-11-07
9748310 Structure and method to reduce shorting in STT-MRAM device Anthony J. Annunziata, Nathan P. Marchack 2017-08-29
9705071 Structure and method to reduce shorting and process degradation in STT-MRAM devices Anthony J. Annunziata, Janusz J. Nowak, Eugene J. O'Sullivan 2017-07-11
9705077 Spin torque MRAM fabrication using negative tone lithography and ion beam etching Anthony J. Annunziata, Armand A. Galan, Steve Holmes, Eric A. Joseph, Qinghuang Lin +1 more 2017-07-11
9691972 Low temperature encapsulation for magnetic tunnel junction Anthony J. Annunziata, Sebastian U. Engelmann, Eric A. Joseph, Nathan P. Marchack, Deborah A. Neumayer +1 more 2017-06-27
9673386 Structure and method to reduce shorting in STT-MRAM device Anthony J. Annunziata, Nathan P. Marchack 2017-06-06
9660179 Enhanced coercivity in MTJ devices by contact depth control Anthony J. Annunziata, Nathan P. Marchack 2017-05-23
9653679 Magnetoresistive structures with stressed layer Anthony J. Annunziata, Chandrasekharan Kothandaraman, Adam M. Pyzyna 2017-05-16
9601686 Magnetoresistive structures with stressed layer Anthony J. Annunziata, Chandrasekharan Kothandaraman, Adam M. Pyzyna 2017-03-21
9543388 Complementary metal-oxide silicon having silicon and silicon germanium channels Isaac Lauer, Alexander Reznicek, Jeffrey W. Sleight 2017-01-10