Issued Patents All Time
Showing 51–70 of 70 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7167992 | Method for controlling the switching of operating modes of an information processor according to the time of switching of the operating modes | Takayuki Katoh, Seiichi Kawano, Noritishi Yoshiyama | 2007-01-23 |
| 7092095 | Method and apparatus for observing and inspecting defects | Yukihiro Shibata, Shunji Maeda, Kazuo Yamaguchi, Minoru Yoshida, Atsushi Yoshida +1 more | 2006-08-15 |
| 7061602 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Takanori Ninomiya +4 more | 2006-06-13 |
| 7061600 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Hitoshi Kubota | 2006-06-13 |
| 6947276 | Process for producing laminated ceramic capacitor | Kazuki Hirata, Kazuhiro Komatsu, Atsuo Nagai | 2005-09-20 |
| 6947587 | Defect inspection method and apparatus | Shunji Maeda, Yukihiro Shibata, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2005-09-20 |
| 6888959 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Takanori Ninomiya +4 more | 2005-05-03 |
| 6690469 | Method and apparatus for observing and inspecting defects | Yukihiro Shibata, Shunji Maeda, Kazuo Yamaguchi, Minoru Yoshida, Atsushi Yoshida +1 more | 2004-02-10 |
| 6674890 | Defect inspection method and apparatus therefor | Shunji Maeda, Hiroshi Makihira, Yasuhiko Nakayama, Minoru Yoshida, Yukihiro Shibata +1 more | 2004-01-06 |
| 6507417 | Method and apparatus for picking up 2D image of an object to be sensed | Hiroshi Makihira, Shunji Maeda, Minoru Yoshida, Yasuhiko Nakayama | 2003-01-14 |
| 6456951 | Method and apparatus for processing inspection data | Shunji Maeda, Yasuhiro Yoshitake, Masataka Shiba, Atsushi Shimoda | 2002-09-24 |
| 6404498 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Hitoshi Kubota | 2002-06-11 |
| 6384247 | Method of producing sesamol formic acid ester and sesamol | Hiroto Tanigawa | 2002-05-07 |
| 6263099 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Hitoshi Kubota | 2001-07-17 |
| 6169282 | Defect inspection method and apparatus therefor | Shunji Maeda, Hiroshi Makihira, Yasuhiko Nakayama, Minoru Yoshida, Yukihiro Shibata +1 more | 2001-01-02 |
| 6091075 | Automatic focus detection method, automatic focus detection apparatus, and inspection apparatus | Yukihiro Shibata, Shunji Maeda, Hiroshi Makihara, Minoru Yoshida, Yasuhiko Nakayama | 2000-07-18 |
| 5914428 | Process for preparation of isocyanate compounds | Toyokazu Yagii, Teruo Itokazu, Yasutaka Tanaka, Hidetaka Kojima, Kiyokazu Murata | 1999-06-22 |
| 5789614 | Process for preparation of aliphatic diisocyanate compounds | Toyokazu Yagii, Teruo Itokazu, Yasutaka Tanaka, Hidetaka Kojima | 1998-08-04 |
| 5774222 | Manufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Hitoshi Kubota | 1998-06-30 |
| 4378705 | Reciprocating device | — | 1983-04-05 |