Issued Patents All Time
Showing 26–50 of 70 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8169606 | Appearance inspection apparatus | Shigeru Matsui | 2012-05-01 |
| 8115043 | Method for producing cyclic olefin compound | Hideyuki Takai, Kyuhei Kitao | 2012-02-14 |
| 8107717 | Defect inspection method and apparatus | Shunji Maeda, Yukihiro Shibata, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2012-01-31 |
| 8040503 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Takanori Ninomiya +4 more | 2011-10-18 |
| 7916929 | Defect inspection method and apparatus | Shunji Maeda, Yukihiro Shibata, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2011-03-29 |
| 7821447 | Bias adjustment of radio frequency unit in radar apparatus | Hiroshi Ito, Jun Ito | 2010-10-26 |
| 7786036 | Dielectric porcelain composition, and method for manufacturing capacitor using the same | Kazuhiro Komatsu, Kazuki Hirata, Atsuo Nagai, Tadashi Onomi | 2010-08-31 |
| 7773210 | Appearance inspection apparatus | Shigeru Matsui | 2010-08-10 |
| 7729516 | Ranging device utilizing image processing | Nobukazu Shima, Akihiro Oota | 2010-06-01 |
| 7643138 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Takanori Ninomiya +4 more | 2010-01-05 |
| 7612706 | Monopulse radar apparatus and antenna switch | Kanako Honda, Kimihisa Yoneda | 2009-11-03 |
| 7557911 | Appearance inspection apparatus | Shigeru Matsui | 2009-07-07 |
| 7512259 | Defect inspection method and apparatus | Shunji Maeda, Yukihiro Shibata, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2009-03-31 |
| 7499162 | Method and apparatus for observing and inspecting defects | Yukihiro Shibata, Shunji Maeda, Kazuo Yamaguchi, Minoru Yoshida, Atsushi Yoshida +1 more | 2009-03-03 |
| 7460220 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Hitoshi Kubota | 2008-12-02 |
| 7417723 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Takanori Ninomiya +4 more | 2008-08-26 |
| 7397419 | Radar apparatus and failure detection method thereof | Masao Nakano | 2008-07-08 |
| 7376247 | Target detection system using radar and image processing | Akihiro Ohta | 2008-05-20 |
| 7335328 | Method for manufacturing multilayer ceramic capacitor | Kazuki Hirata, Kazuhiro Komatsu, Atsuo Nagai | 2008-02-26 |
| 7274813 | Defect inspection method and apparatus | Shunji Maeda, Yukihiro Shibata, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2007-09-25 |
| 7266221 | Ranging device utilizing image processing | Nobukazu Shima, Akihiro Oota | 2007-09-04 |
| 7233279 | Method and device for distance measurement by pulse radar | Masayoshi Moriya, Satoshi Ishii, Tetsuo Seki, Kazuaki Hamada, Akihiro Ohta | 2007-06-19 |
| 7221486 | Method and apparatus for picking up 2D image of an object to be sensed | Hiroshi Makihira, Shunji Maeda, Minoru Yoshida, Yasuhiko Nakayama | 2007-05-22 |
| 7180584 | Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected | Shunji Maeda, Yasuhiko Nakayama, Minoru Yoshida, Hitoshi Kubota | 2007-02-20 |
| 7181634 | Apparatus for switching between a combination of operating modes such that the power consumed is reduced relative to the time of switching | Takayuki Katoh, Seiichi Kawano, Noritishi Yoshiyama | 2007-02-20 |