YS

Yukihiro Shibata

HH Hitachi High-Technologies: 40 patents #28 of 1,917Top 2%
HI Hitachi: 27 patents #1,104 of 28,497Top 4%
KS Kyocera Document Solutions: 13 patents #207 of 1,545Top 15%
KT Kabushiki Kaisha Toshiba: 4 patents #6,684 of 21,451Top 35%
Sharp Kabushiki Kaisha: 3 patents #4,164 of 10,731Top 40%
TO Toyota: 3 patents #8,352 of 26,838Top 35%
SM Shibaura Mechatronics: 2 patents #66 of 175Top 40%
CC Chlorine Engineers Corp.: 2 patents #28 of 106Top 30%
AK Aisan Kogyo Kabushiki Kaisha: 1 patents #344 of 642Top 55%
SC Shindengen Electric Manufacturing Co.: 1 patents #159 of 307Top 55%
TT The University Of Tokyo: 1 patents #1,000 of 2,633Top 40%
Mazda Motor: 1 patents #2,563 of 4,755Top 55%
Overall (All Time): #16,837 of 4,157,543Top 1%
93
Patents All Time

Issued Patents All Time

Showing 76–93 of 93 patents

Patent #TitleCo-InventorsDate
6850320 Method for inspecting defects and an apparatus for the same Shunji Maeda, Yukio Kembo 2005-02-01
6819416 Defect inspection method and apparatus therefor Shunji Maeda, Atsushi Yoshida, Minoru Yoshida, Sachio Uto, Hiroaki Shishido +1 more 2004-11-16
6762831 Method and apparatus for inspecting defects Shunji Maeda 2004-07-13
6690469 Method and apparatus for observing and inspecting defects Shunji Maeda, Kazuo Yamaguchi, Minoru Yoshida, Atsushi Yoshida, Kenji Oka +1 more 2004-02-10
6674890 Defect inspection method and apparatus therefor Shunji Maeda, Kenji Oka, Hiroshi Makihira, Yasuhiko Nakayama, Minoru Yoshida +1 more 2004-01-06
6654112 Apparatus and method for inspecting defects Minori Noguchi, Shunji Maeda, Takanori Ninomiya 2003-11-25
6621571 Method and apparatus for inspecting defects in a patterned specimen Shunji Maeda, Atsushi Yoshida, Toshihiko Nakata, Hiroaki Shishido, Minoru Yoshida +1 more 2003-09-16
6556290 Defect inspection method and apparatus therefor Shunji Maeda, Atsushi Yoshida, Minoru Yoshida, Sachio Uto, Hiroaki Shishido +1 more 2003-04-29
6400454 Apparatus and method for inspector defects Minori Noguchi, Shunji Maeda, Takanori Ninomiya 2002-06-04
6169282 Defect inspection method and apparatus therefor Shunji Maeda, Kenji Oka, Hiroshi Makihira, Yasuhiko Nakayama, Minoru Yoshida +1 more 2001-01-02
6132162 Storage construction for spare tire of motor vehicle Yasuo Kito, Masanobu Hanazaki, Kei Ikeda 2000-10-17
6091075 Automatic focus detection method, automatic focus detection apparatus, and inspection apparatus Shunji Maeda, Hiroshi Makihara, Minoru Yoshida, Yasuhiko Nakayama, Kenji Oka 2000-07-18
5862852 Production method for a cylinder block of an internal combustion engine Shigeki Okaguchi, Mitsuhiro Karaki 1999-01-26
5684565 Pattern detecting method, pattern detecting apparatus, projection exposing apparatus using the same and exposure system Yoshitada Oshida, Hisafumi Iwata, Yasuhiro Yoshitake, Minoru Yoshida 1997-11-04
5614926 Word processor with a handwriting text processing function Hiroyuki Shigematsu, Hirofumi Nishikawa 1997-03-25
5583543 Pen input processing apparatus Masamitsu Takahashi, Aki Miake, Hiroshi Okuno, Hiroshi Nishida, Yutaka Nakamura +2 more 1996-12-10
5329289 Data processor with rotatable display Kohichiro Sakamoto, Yoshiyuki Murashima, Hiroshi Nishida 1994-07-12
5302999 Illumination method, illumination apparatus and projection exposure apparatus Yoshitada Oshida, Tutomu Tawa, Shigemi Ishii, Minori Noguchi, Tsuneo Terasawa +1 more 1994-04-12