Issued Patents All Time
Showing 26–50 of 93 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9255793 | Defect inspection method and device thereof | Toshifumi Honda, Taketo Ueno, Atsushi Taniguchi | 2016-02-09 |
| 9239283 | Defect inspection method and device therefor | Toshifumi Honda, Atsushi Taniguchi | 2016-01-19 |
| 9182592 | Optical filtering device, defect inspection method and apparatus therefor | Taketo Ueno, Toshihiko Nakata, Shun'ichi Matsumoto, Atsushi Taniguchi, Hiroshi Toshiyoshi +2 more | 2015-11-10 |
| 8970836 | Defect inspecting apparatus and defect inspecting method | Atsushi Taniguchi, Taketo Ueno, Shunichi Matsumoto, Toshifumi Honda | 2015-03-03 |
| 8958062 | Defect inspection method and device using same | Toshiyuki Nakao, Yuta Urano, Toshifumi Honda | 2015-02-17 |
| 8922764 | Defect inspection method and defect inspection apparatus | Yuta Urano, Toshifumi Honda | 2014-12-30 |
| 8885037 | Defect inspection method and apparatus therefor | Atsushi Taniguchi, Taketo Ueno, Toshihiko Nakata | 2014-11-11 |
| 8830465 | Defect inspecting apparatus and defect inspecting method | Atsushi Taniguchi, Taketo Ueno, Shunichi Matsumoto | 2014-09-09 |
| 8804110 | Fault inspection device and fault inspection method | Yuta Urano, Shigenobu Maruyama, Toshiyuki Nakao, Toshifumi Honda | 2014-08-12 |
| 8804112 | Method of defect inspection and device of defect inspection | Toshihiko Nakata, Taketo Ueno, Atsushi Taniguchi, Toshifumi Honda | 2014-08-12 |
| 8751702 | Communication processing device that stores communication data in buffers, image forming apparatus, and method of communication processing | — | 2014-06-10 |
| 8711347 | Defect inspection method and device therefor | Toshifumi Honda, Yuta Urano, Toshiyuki Nakao | 2014-04-29 |
| 8681328 | Dark-field defect inspecting method, dark-field defect inspecting apparatus, aberration analyzing method, and aberration analyzing apparatus | Atsushi Taniguchi, Taketo Ueno, Shunji Maeda, Tetsuya Matsui | 2014-03-25 |
| 8670116 | Method and device for inspecting for defects | Toshiyuki Nakao, Junguo Xu, Yuki Shimizu, Toshihiko Nakata, Toshifumi Honda +1 more | 2014-03-11 |
| 8454754 | Cleaning method and method for manufacturing electronic device | Naoya Hayamizu, Masaaki Kato, Nobuo Kobayashi | 2013-06-04 |
| 8416402 | Method and apparatus for inspecting defects | Yasuhiro Yoshitake | 2013-04-09 |
| 8416292 | Defect inspection apparatus and method | Yasuhiro Yoshitake | 2013-04-09 |
| 8303797 | Cleaning system and cleaning method | Naoya Hayamizu, Masaaki Kato, Hiroyuki Fukui | 2012-11-06 |
| 8236161 | Apparatus for electrolyzing sulfuric acid, method of performing electrolysis, and apparatus for processing a substrate | Nobuo Kobayashi, Naoya Hayamizu, Masaaki Kato | 2012-08-07 |
| 8228494 | Apparatus for inspecting defects | Shunji Maeda | 2012-07-24 |
| 8203706 | Method and apparatus for inspecting defects | Yasuhiro Yoshitake | 2012-06-19 |
| 8121398 | Method and apparatus for inspecting defects | Yasuhiro Yoshitake, Hiroyuki Nakano | 2012-02-21 |
| 8107717 | Defect inspection method and apparatus | Shunji Maeda, Kenji Oka, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2012-01-31 |
| 8105728 | Polyelectrolyte material, method for producing polyelectrolyte material, polyelectrolyte component, fuel cell, and method for producing fuel cell | Naoya Hayamizu, Akiko Saito, Jun Momma, Hideo Oota | 2012-01-31 |
| 8004666 | Apparatus for inspecting defects | Shunji Maeda | 2011-08-23 |