Issued Patents All Time
Showing 26–50 of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8431915 | Charged particle beam apparatus permitting high resolution and high-contrast observation | Muneyuki Fukuda, Tomoyasu Shojo, Noritsugu Takahashi | 2013-04-30 |
| 8431893 | Electron beam apparatus and electron beam inspection method | Muneyuki Fukuda, Tomoyasu Shojo, Mitsugu Sato, Atsuko Fukada, Ichiro Tachibana | 2013-04-30 |
| 8405026 | Charged particle beam apparatus | Tomoyasu Shojo, Muneyuki Fukuda, Noritsugu Takahashi | 2013-03-26 |
| 8389935 | Charged particle beam apparatus permitting high-resolution and high-contrast observation | Muneyuki Fukuda, Tomoyasu Shojo, Noritsugu Takahashi | 2013-03-05 |
| 8222601 | Scanning electron microscope and method of imaging an object by using the scanning electron microscope | Ichiro Tachibana, Mitsugu Sato | 2012-07-17 |
| 8207498 | Electron beam apparatus and electron beam inspection method | Muneyuki Fukuda, Tomoyasu Shojo, Mitsugu Sato, Atsuko Fukada, Ichiro Tachibana | 2012-06-26 |
| 8153969 | Inspection method and inspection system using charged particle beam | Atsuko Fukada, Mitsugu Sato, Hidetoshi Nishiyama, Muneyuki Fukuda, Noritsugu Takahashi | 2012-04-10 |
| 7888640 | Scanning electron microscope and method of imaging an object by using the scanning electron microscope | Ichiro Tachibana, Mitsugu Sato | 2011-02-15 |
| 7875849 | Electron beam apparatus and electron beam inspection method | Muneyuki Fukuda, Tomoyasu Shojo, Mitsugu Sato, Atsuko Fukada, Ichiro Tachibana | 2011-01-25 |
| 7772553 | Scanning electron microscope | — | 2010-08-10 |
| 7619219 | Scanning electron microscope | Hiroyuki Ito, Ichiro Tachibana | 2009-11-17 |
| 7557347 | Charged particle beam apparatus, scanning electron microscope, and sample observation method using the same | Tomoyasu Shojo, Muneyuki Fukuda | 2009-07-07 |
| 7504626 | Scanning electron microscope and apparatus for detecting defect | Ichiro Tachibana, Mitsugu Sato, Atsuko Fukada, Muneyuki Fukuda | 2009-03-17 |
| 7462828 | Inspection method and inspection system using charged particle beam | Atsuko Fukada, Mitsugu Sato, Hidetoshi Nishiyama, Muneyuki Fukuda, Noritsugu Takahashi | 2008-12-09 |
| 7449690 | Inspection method and inspection apparatus using charged particle beam | Hidetoshi Nishiyama, Muneyuki Fukuda, Noritsugu Takahashi, Mitsugu Sato, Atsuko Fukada | 2008-11-11 |
| 7399966 | Scanning electron microscope | Hideo Todokoro, Makoto Ezumi, Yoichi Ose | 2008-07-15 |
| 7383068 | Collapsible mobile communication terminal device | Yasuhiko Oota, Kazufumi Takeshita, Seiji Miyashita | 2008-06-03 |
| 7359506 | Opening and closing device and electronic equipment using the same | Takehiko Konja, Yasuchika Kudo, Katsuichi Minami, Koji Sakai, Katsumasa Yamaguchi +1 more | 2008-04-15 |
| 7294835 | Scanning electron microscope | Hideo Todokoro, Makoto Ezumi, Yoichi Ose | 2007-11-13 |
| 7049591 | Scanning electron microscope | Hideo Todokoro, Makoto Ezumi, Yoichi Ose | 2006-05-23 |
| 6979821 | Scanning electron microscope | Toshiro Kubo, Noriaki Arai, Mitsugu Sato, Hideo Todokoro, Yoichi Ose | 2005-12-27 |
| 6847038 | Scanning electron microscope | Hideo Todokoro, Makoto Ezumi, Yoichi Ose | 2005-01-25 |
| 6765205 | Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same | Isao Ochiai, Toshiei Kurosaki, Toshiro Kubo | 2004-07-20 |
| 6646262 | Scanning electron microscope | Hideo Todokoro, Makoto Ezumi, Yoichi Ose | 2003-11-11 |
| 6555819 | Scanning electron microscope | Toshiro Kubo, Noriaki Arai, Mitsugu Sato, Hideo Todokoro, Yoichi Ose | 2003-04-29 |