Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10971328 | Charged particle beam device | Takanori Kishimoto, Naomasa Suzuki | 2021-04-06 |
| 10734191 | Charged particle beam device | Takanori Kishimoto, Naomasa Suzuki | 2020-08-04 |
| 9324540 | Charged particle beam device | Naomasa Suzuki | 2016-04-26 |
| 8729467 | Charged particle radiation device | Hiroshi Tsuji | 2014-05-20 |
| 8629410 | Charged particle radiation device | Hiroshi Tsuji, Kouji Ishiguro, Naomasa Suzuki, Katsunori Onuki | 2014-01-14 |
| 8431893 | Electron beam apparatus and electron beam inspection method | Muneyuki Fukuda, Tomoyasu Shojo, Mitsugu Sato, Atsuko Fukada, Naomasa Suzuki | 2013-04-30 |
| 8222601 | Scanning electron microscope and method of imaging an object by using the scanning electron microscope | Mitsugu Sato, Naomasa Suzuki | 2012-07-17 |
| 8207498 | Electron beam apparatus and electron beam inspection method | Muneyuki Fukuda, Tomoyasu Shojo, Mitsugu Sato, Atsuko Fukada, Naomasa Suzuki | 2012-06-26 |
| 7888640 | Scanning electron microscope and method of imaging an object by using the scanning electron microscope | Mitsugu Sato, Naomasa Suzuki | 2011-02-15 |
| 7875849 | Electron beam apparatus and electron beam inspection method | Muneyuki Fukuda, Tomoyasu Shojo, Mitsugu Sato, Atsuko Fukada, Naomasa Suzuki | 2011-01-25 |
| 7619219 | Scanning electron microscope | Naomasa Suzuki, Hiroyuki Ito | 2009-11-17 |
| 7504626 | Scanning electron microscope and apparatus for detecting defect | Mitsugu Sato, Atsuko Fukada, Naomasa Suzuki, Muneyuki Fukuda | 2009-03-17 |