BA

Brent A. Anderson

Globalfoundries: 38 patents #63 of 4,424Top 2%
Samsung: 4 patents #25,854 of 75,807Top 35%
ET Elpis Technologies: 2 patents #16 of 121Top 15%
TC Toshiba America Electronic Components: 1 patents #23 of 77Top 30%
📍 Jericho, VT: #1 of 170 inventorsTop 1%
🗺 Vermont: #2 of 4,968 inventorsTop 1%
Overall (All Time): #321 of 4,157,543Top 1%
542
Patents All Time

Issued Patents All Time

Showing 376–400 of 542 patents

Patent #TitleCo-InventorsDate
8003516 BEOL interconnect structures and related fabrication methods Edward J. Nowak, Jed H. Rankin 2011-08-23
7994612 FinFETs single-sided implant formation Andres Bryant, Josephine B. Chang, Omer H. Dokumaci, Edward J. Nowak 2011-08-09
7993989 Vertical spacer forming and related transistor Edward J. Nowak 2011-08-09
7981772 Methods of fabricating nanostructures Andres Bryant, Edward J. Nowak, Jeffrey W. Sleight 2011-07-19
7982269 Transistors having asymmetric strained source/drain portions Andres Bryant, Edward J. Nowak 2011-07-19
7984394 Design structure for a redundant micro-loop structure for use in an integrated circuit physical design process and method of forming the same Jeanne P. Bickford, Markus Buehler, Jason D. Hibbeler, Juergen Koehl, Edward J. Nowak 2011-07-19
7979836 Split-gate DRAM with MuGFET, design structure, and method of manufacture Edward J. Nowak 2011-07-12
7971158 Spacer fill structure, method and design structure for reducing device variation Andres Bryant, Edward J. Nowak, Jed H. Rankin 2011-06-28
7964465 Transistors having asymmetric strained source/drain portions Andres Bryant, Edward J. Nowak 2011-06-21
7964922 Structure, design structure and method of manufacturing dual metal gate VT roll-up structure Edward J. Nowak 2011-06-21
7964467 Method, structure and design structure for customizing history effects of soi circuits Edward J. Nowak 2011-06-21
7960791 Dense pitch bulk FinFET process by selective EPI and etch Edward J. Nowak 2011-06-14
7960836 Redundant micro-loop structure for use in an integrated circuit physical design process and method of forming the same Jeanne P. Bickford, Markus Buehler, Jason D. Hibbeler, Juergen Koehl, Edward J. Nowak 2011-06-14
7952088 Semiconducting device having graphene channel Edward J. Nowak 2011-05-31
7951678 Metal-gate high-k reference structure Edward J. Nowak 2011-05-31
7943997 Fully-depleted low-body doping field effect transistor (FET) with reverse short channel effects (SCE) induced by self-aligned edge back-gate(s) James W. Adkisson, Andres Bryant, William F. Clark, Jr., Edward J. Nowak 2011-05-17
7935560 Imagers having electrically active optical elements John J. Ellis-Monaghan, Edward J. Nowak 2011-05-03
7937675 Structure including transistor having gate and body in direct self-aligned contact Andres Bryant, William F. Clark, Jr., Edward J. Nowak 2011-05-03
7929117 Apparatus for real-time contamination, environmental, or physical monitoring of a photomask Robert K. Leidy, Jed H. Rankin 2011-04-19
7915162 Method of forming damascene filament wires Andres Bryant, Jeffrey P. Gambino, Anthony K. Stamper 2011-03-29
7915670 Asymmetric field effect transistor structure and method Andres Bryant, William F. Clark, Jr., Edward J. Nowak 2011-03-29
7910418 Complementary metal gate dense interconnect and method of manufacturing Andres Bryant, William F. Clark, Jr., Edward J. Nowak 2011-03-22
7902625 Metal-gate thermocouple Andres Bryant, Edward J. Nowak 2011-03-08
7902000 MugFET with stub source and drain regions Andres Bryant, Edward J. Nowak 2011-03-08
7902608 Integrated circuit device with deep trench isolation regions for all inter-well and intra-well isolation and with a shared contact to a junction between adjacent device diffusion regions and an underlying floating well section Andres Bryant, Edward J. Nowak 2011-03-08