BA

Brent A. Anderson

Globalfoundries: 38 patents #63 of 4,424Top 2%
Samsung: 4 patents #25,854 of 75,807Top 35%
ET Elpis Technologies: 2 patents #16 of 121Top 15%
TC Toshiba America Electronic Components: 1 patents #23 of 77Top 30%
📍 Jericho, VT: #1 of 170 inventorsTop 1%
🗺 Vermont: #2 of 4,968 inventorsTop 1%
Overall (All Time): #321 of 4,157,543Top 1%
542
Patents All Time

Issued Patents All Time

Showing 401–425 of 542 patents

Patent #TitleCo-InventorsDate
7898065 Structure and method for device-specific fill for improved anneal uniformity Edward J. Nowak 2011-03-01
7888780 Semiconductor structures incorporating multiple crystallographic planes and methods for fabrication thereof Edward J. Nowak, Jed H. Rankin 2011-02-15
7888750 Multi-fin multi-gate field effect transistor with tailored drive current Edward J. Nowak 2011-02-15
7888743 Substrate backgate for trigate FET Matthew J. Breitwisch, Edward J. Nowak 2011-02-15
7888736 MUGFET with optimized fill structures Andres Bryant, Edward J. Nowak 2011-02-15
7877712 System for and method of verifying IC authenticity Edward J. Nowak 2011-01-25
7871876 Method of forming a dual-plane complementary metal oxide semiconductor Edward J. Nowak 2011-01-18
7851865 Fin-type field effect transistor structure with merged source/drain silicide and method of forming the structure Andres Bryant, John J. Ellis-Monaghan, Edward J. Nowak 2010-12-14
7851315 Method for fabricating a field effect transistor having a dual thickness gate electrode Andres Bryant, William F. Clark, Jr., Edward J. Nowak 2010-12-14
7851283 Field effect transistor with raised source/drain fin straps Thomas Ludwig, Edward J. Nowak 2010-12-14
7847320 Dense chevron non-planar field effect transistors and method Andres Bryant, Edward J. Nowak 2010-12-07
7843016 Asymmetric field effect transistor structure and method Andres Bryant, William F. Clark, Jr., Edward J. Nowak 2010-11-30
7838355 Differential nitride pullback to create differential NFET to PFET divots for improved performance versus leakage Suk Hoon Ku, Edward J. Nowak 2010-11-23
7838353 Field effect transistor with suppressed corner leakage through channel material band-edge modulation, design structure and method Edward J. Nowak 2010-11-23
7829407 Method of fabricating a stressed MOSFET by bending SOI region Andres Bryant, Edward J. Nowak 2010-11-09
7821109 Stressed dielectric devices and methods of fabricating same Edward J. Nowak 2010-10-26
7816738 Low-cost FEOL for ultra-low power, near sub-vth device structures Andres Bryant, William F. Clark, Jr., Jeffrey P. Gambino, Shih-Fen Huang, Edward J. Nowak +1 more 2010-10-19
7811875 Dual work-function single gate stack Edward J. Nowak 2010-10-12
7811871 Low-capacitance contact for long gate-length devices with small contacted pitch Edward J. Nowak 2010-10-12
7799609 Method of manufacturing dual orientation wafers John J. Ellis-Monaghan, Alain Loiseau, Kirk D. Peterson 2010-09-21
7795098 Rotated field effect transistors and method of manufacture Andres Bryant, Myung-Hee Na, Edward J. Nowak 2010-09-14
7790611 Method for FEOL and BEOL wiring John J. Ellis-Monaghan, Edward J. Nowak, Jed H. Rankin 2010-09-07
7790636 Simultaneous irradiation of a substrate by multiple radiation sources Edward J. Nowak 2010-09-07
7791166 Formation of dummy features and inductors in semiconductor fabrication Howard S. Landis, Edward J. Nowak 2010-09-07
7791365 Remotely configurable chip and associated method Joseph J. Czajkowski 2010-09-07