BA

Brent A. Anderson

Globalfoundries: 38 patents #63 of 4,424Top 2%
Samsung: 4 patents #25,854 of 75,807Top 35%
ET Elpis Technologies: 2 patents #16 of 121Top 15%
TC Toshiba America Electronic Components: 1 patents #23 of 77Top 30%
📍 Jericho, VT: #1 of 170 inventorsTop 1%
🗺 Vermont: #2 of 4,968 inventorsTop 1%
Overall (All Time): #321 of 4,157,543Top 1%
542
Patents All Time

Issued Patents All Time

Showing 351–375 of 542 patents

Patent #TitleCo-InventorsDate
8198682 Semiconductor structure having a gate electrode at least partially disposed in a trench formed at a bend in a semiconductor material Andres Bryant, Edward J. Nowak 2012-06-12
8193067 Integrated circuit and a method using integrated process steps to form deep trench isolation structures and deep trench capacitor structures for the integrated circuit Andres Bryant, Herbert L. Ho, Edward J. Nowak 2012-06-05
8188546 Multi-gate non-planar field effect transistor structure and method of forming the structure using a dopant implant process to tune device drive current Edward J. Nowak 2012-05-29
8184472 Split-gate DRAM with lateral control-gate MuGFET Edward J. Nowak 2012-05-22
8158500 Field effect transistors (FETS) and methods of manufacture Edward J. Nowak 2012-04-17
8159008 Method of fabricating a trench-generated transistor structure Edward J. Nowak 2012-04-17
8138072 Semiconductor structures and methods of manufacture Edward J. Nowak 2012-03-20
8136055 Systems for real-time contamination, environmental, or physical monitoring of a photomask Robert K. Leidy, Jed H. Rankin 2012-03-13
8125037 Field effect transistor with channel region edge and center portions having different band structures for suppressed corner leakage Edward J. Nowak 2012-02-28
8125007 Integrated circuit including FinFET RF switch angled relative to planar MOSFET and related design structure Alvin J. Joseph, Edward J. Nowak 2012-02-28
8115251 Recessed gate channel with low Vt corner Andres Bryant, Edward J. Nowak 2012-02-14
8080485 Localized temperature control during rapid thermal anneal Edward J. Nowak 2011-12-20
8080465 Semiconductor wafer structure with balanced reflectance and absorption characteristics for rapid thermal anneal uniformity Edward J. Nowak 2011-12-20
8076204 Graphene-based transistor Edward J. Nowak 2011-12-13
8053318 FET with replacement gate structure and method of fabricating the same Edward J. Nowak 2011-11-08
8053314 Asymmetric field effect transistor structure and method Andres Bryant, William F. Clark, Jr., Edward J. Nowak 2011-11-08
8053348 Method of forming a semiconductor device using a sacrificial uniform vertical thickness spacer structure Edward J. Nowak 2011-11-08
8053870 Semiconductor structure incorporating multiple nitride layers to improve thermal dissipation away from a device and a method of forming the structure Joseph M. Lukaitis, Jed H. Rankin, Robert R. Robison 2011-11-08
8039929 Asymmetrically stressed CMOS FinFET Edward J. Nowak 2011-10-18
8039908 Damascene gate having protected shorting regions Edward J. Nowak, Jed H. Rankin 2011-10-18
8036022 Structure and method of using asymmetric junction engineered SRAM pass gates, and design structure Edward J. Nowak 2011-10-11
8028924 Device and method for providing an integrated circuit with a unique identification Andres Bryant, Alain Loiseau, Anthony K. Stamper, Mickey H. Yu 2011-10-04
8022478 Method of forming a multi-fin multi-gate field effect transistor with tailored drive current Edward J. Nowak 2011-09-20
8021803 Multi-chip reticle photomasks Jed H. Rankin 2011-09-20
8003463 Structure, design structure and method of manufacturing dual metal gate Vt roll-up structure Edward J. Nowak 2011-08-23