Issued Patents All Time
Showing 26–50 of 69 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7161370 | Semiconductor testing device | Kazuhiro Tashiro, Makoto Haseyama | 2007-01-09 |
| 7145250 | LSI package, LSI element testing method, and semiconductor device manufacturing method | Toru Nishino, Kazuhiro Tashiro | 2006-12-05 |
| 7129726 | Testing device and testing method of a semiconductor device | Kazuhiro Tashiro, Yasuyuki Itou, Yoshikazu Arisaka | 2006-10-31 |
| 7112889 | Semiconductor device having an alignment mark formed by the same material with a metal post | Yasuyuki Itoh, Tetsurou Honda, Kazuhiro Tashiro, Makoto Haseyama, Kenichi Nagashige +2 more | 2006-09-26 |
| 7071487 | Wafer-level package having test terminal | — | 2006-07-04 |
| 7038477 | Contactor having conductive particles in a hole as a contact electrode | Susumu Kida, Naoyuki Watanabe, Takafumi Hashitani, Ei Yano, Ichiro Midorikawa | 2006-05-02 |
| 7028398 | Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor | Makoto Haseyama | 2006-04-18 |
| 6939142 | Semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece | Hirohisa Matsuki | 2005-09-06 |
| 6937038 | Contactor having conductive particles in a hole as a contact electrode | Susumu Kida, Naoyuki Watanabe, Takafumi Hashitani, Ei Yano, Ichiro Midorikawa | 2005-08-30 |
| 6927343 | Contactor for testing miniaturized devices and components | Naoyuki Watanabe, Kazuhiro Tashiro, Daisuke Koizumi, Takafumi Hashitani | 2005-08-09 |
| 6924174 | Method of attaching electronic component and electronic component attaching tool | Daisuke Koizumi, Kazuhiro Tashiro, Naoyuki Watanabe | 2005-08-02 |
| 6882169 | Semiconductor testing device | Kazuhiro Tashiro, Makoto Haseyama | 2005-04-19 |
| 6881611 | Method and mold for manufacturing semiconductor device, semiconductor device and method for mounting the device | Norio Fukasawa, Toshimi Kawahara, Muneharu Morioka, Mitsunada Osawa, Yasuhiro Shinma +6 more | 2005-04-19 |
| 6806723 | Contactor having contact electrodes formed by laser processing | Keisuke Fukuda, Naoyuki Watanabe, Takumi Kumatabara, Naohisa Matsushita, Masayuki Imakado +2 more | 2004-10-19 |
| 6791345 | Contactor for testing semiconductor device and manufacturing method thereof | Kazuhiro Tashiro, Naoyuki Watanabe, Daisuke Koizumi, Takafumi Hashitani, Ei Yano | 2004-09-14 |
| 6784657 | Handling apparatus and test set using the handling apparatus | Keiji Fujishiro, Yasunori Sato, Naohito Kohashi | 2004-08-31 |
| 6781395 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Futoshi Fukaya, Makoto Haseyama | 2004-08-24 |
| 6774650 | Probe card and method of testing wafer having a plurality of semiconductor devices | Daisuke Koizumi, Naoyuki Watanabe, Yoshito Konno, Eiji Yoshida, Toshiyuki Honda +2 more | 2004-08-10 |
| 6767219 | Contactor, method for manufacturing such contactor, and testing method using such contactor | Naoyuki Watanabe, Kazuhiro Tashiro, Naohito Kohashi, Osamu Igawa, Tetsuya Fujisawa | 2004-07-27 |
| 6762431 | Wafer-level package with test terminals | — | 2004-07-13 |
| 6696754 | Semiconductor module including a plurality of semiconductor devices detachably | Mitsutaka Sato, Tetsuya Fujisawa, Junichi Kasai, Toshimi Kawahara, Toshio Hamano +5 more | 2004-02-24 |
| 6661247 | Semiconductor testing device | Kazuhiro Tashiro, Makoto Haseyama, Futoshi Fukaya | 2003-12-09 |
| 6643922 | Device testing contactor, method of producing the same, and device testing carrier | Makoto Haseyama | 2003-11-11 |
| 6630839 | Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor | Makoto Haseyama | 2003-10-07 |
| 6603325 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Futoshi Fukaya, Makoto Haseyama | 2003-08-05 |