Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7649370 | Evaluation method of probe mark of probe needle of probe card using imaginary electrode pad and designated determination frame | Yoshihiko Endou, Tatsuya Miyazaki | 2010-01-19 |
| 7471096 | Contactor for electronic parts and a contact method | Naohito Kohashi, Shigeyuki Maruyama, Hiroyuki Murotani, Katsuhiko Ono | 2008-12-30 |
| 7355421 | Semiconductor apparatus testing arrangement and semiconductor apparatus testing method | Shigeyuki Maruyama, Kazuhiro Tashiro, Takayuki Katayama, Tetsu Ozawa, Yuushin Kimura | 2008-04-08 |
| 7256591 | Probe card, having cantilever-type probe and method | Tsutomu Tatematsu, Kenji Togashi, Tetsuhiro Nanbu, Shigenobu Ishihara, Morihiko Hamada +2 more | 2007-08-14 |
| 7180312 | Probe card and method for manufacturing probe card | Kunihiro Itagaki, Shigenobu Ishihara, Tomohiro Giga, Naoyoshi Kikuchi | 2007-02-20 |
| 7171592 | Self-testing circuit in semiconductor memory device | Kenji Togashi, Morihiko Hamada, Shigekazu Aoki, Katsumi Shigenobu, Yukio Saka +2 more | 2007-01-30 |
| 7129726 | Testing device and testing method of a semiconductor device | Kazuhiro Tashiro, Yasuyuki Itou, Shigeyuki Maruyama | 2006-10-31 |
| 6686644 | Semiconductor device provided with fuse and method of disconnecting fuse | Tsutomu Tatematsu, Kengi Togashi, Masayuki Nakada, Toyoji Sawada, Kazuo Sukegawa +1 more | 2004-02-03 |