Issued Patents All Time
Showing 1–25 of 38 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11072236 | Fuel supply device | Takanori Sakai, Shinji Shimokawa, Toshikazu Ito | 2021-07-27 |
| 10882393 | Fuel supply device | Koji Kojima, Takanori Sakai, Yoshihiro Ito, Shinji Shimokawa | 2021-01-05 |
| 8797055 | Prober and method of inspecting semiconductor chip | — | 2014-08-05 |
| 8759119 | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state | Shigeyuki Maruyama, Yasuyuki Itoh, Tetsurou Honda, Makoto Haseyama, Kenichi Nagashige +2 more | 2014-06-24 |
| 8671557 | Tray in combination with electronic component attaching tool attached to the tray | Daisuke Koizumi, Shigeyuki Maruyama, Naoyuki Watanabe | 2014-03-18 |
| 8404496 | Method of testing a semiconductor device and suctioning a semiconductor device in the wafer state | Shigeyuki Maruyama, Yasuyuki Itoh, Tetsurou Honda, Makoto Haseyama, Kenichi Nagashige +2 more | 2013-03-26 |
| 8268670 | Method of semiconductor device protection | Keisuke Fukuda, Naohito Kohashi, Shigeyuki Maruyama | 2012-09-18 |
| 8164181 | Semiconductor device packaging structure | Keisuke Fukuda, Naohito Kohashi, Shigeyuki Maruyama | 2012-04-24 |
| 8159250 | Testing device for testing a semiconductor device | Yuji Maruyama, Kazuhiko Shimabayashi, Shigeru Goto, Takayuki Nakashiro, Susumu Koshinuma +1 more | 2012-04-17 |
| 8051554 | IC socket with attached electronic component | Daisuke Koizumi, Shigeyuki Maruyama, Naoyuki Watanabe | 2011-11-08 |
| 7915720 | Semiconductor integrated circuit device and test method thereof | Hitoshi Izuru | 2011-03-29 |
| 7825676 | Contactor and test method using contactor | Daisuke Koizumi, Naohito Kohashi, Takumi Kumatabara | 2010-11-02 |
| 7807481 | Method of semiconductor device protection, package of semiconductor device | Keisuke Fukuda, Naohito Kohashi, Shigeyuki Maruyama | 2010-10-05 |
| 7518388 | Contactor for electronic components and test method using the same | Shigeyuki Maruyama, Daisuke Koizumi, Takumi Kumatabara, Keisuke Fukuda | 2009-04-14 |
| 7430798 | Electronic component attaching tool | Daisuke Koizumi, Shigeyuki Maruyama, Naoyuki Watanabe | 2008-10-07 |
| 7403024 | Contactor having contact electrodes of metal springs embedded in a plate-like structure | Shigeyuki Maruyama, Naoyuki Watanabe, Daisuke Koizumi, Takafumi Hashitani, Ei Yano | 2008-07-22 |
| 7382046 | Semiconductor device protection cover, and semiconductor device unit including the cover | Keisuke Fukuda, Naohito Kohashi, Shigeyuki Maruyama | 2008-06-03 |
| 7355421 | Semiconductor apparatus testing arrangement and semiconductor apparatus testing method | Shigeyuki Maruyama, Yoshikazu Arisaka, Takayuki Katayama, Tetsu Ozawa, Yuushin Kimura | 2008-04-08 |
| D565057 | Image for a portable phone | Hiroshi Yamazaki, Masakazu Yoshida | 2008-03-25 |
| 7309996 | Contactor for electronic components and test method using the same | Shigeyuki Maruyama, Daisuke Koizumi, Takumi Kumatabara, Keisuke Fukuda | 2007-12-18 |
| D544876 | Image for a portable phone | Hiroshi Yamazaki, Masakazu Yoshida | 2007-06-19 |
| 7199600 | Semiconductor device testing method and testing equipment | Hitoshi Izuru | 2007-04-03 |
| 7161370 | Semiconductor testing device | Shigeyuki Maruyama, Makoto Haseyama | 2007-01-09 |
| 7145250 | LSI package, LSI element testing method, and semiconductor device manufacturing method | Shigeyuki Maruyama, Toru Nishino | 2006-12-05 |
| 7129726 | Testing device and testing method of a semiconductor device | Yasuyuki Itou, Shigeyuki Maruyama, Yoshikazu Arisaka | 2006-10-31 |