Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7355421 | Semiconductor apparatus testing arrangement and semiconductor apparatus testing method | Shigeyuki Maruyama, Yoshikazu Arisaka, Kazuhiro Tashiro, Takayuki Katayama, Yuushin Kimura | 2008-04-08 |