Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8736295 | Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method | Yuichi Watanabe, Kiyotaka Shinada, Shigeru Goto, Yasuhiko Tandou, Eiji Takada +1 more | 2014-05-27 |
| 7355421 | Semiconductor apparatus testing arrangement and semiconductor apparatus testing method | Shigeyuki Maruyama, Yoshikazu Arisaka, Kazuhiro Tashiro, Takayuki Katayama, Tetsu Ozawa | 2008-04-08 |