Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8736295 | Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method | Yuichi Watanabe, Yuushin Kimura, Shigeru Goto, Yasuhiko Tandou, Eiji Takada +1 more | 2014-05-27 |